2 results
Stress Liner Proximity Technique to Enhance Carrier Mobility in High-κ Metal Gate MOSFETs
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1194 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1194-A04-02
- Print publication:
- 2009
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- Article
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Diffusion and Defect Structure in Nitrogen Implanted Silicon
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- Journal:
- MRS Online Proceedings Library Archive / Volume 669 / 2001
- Published online by Cambridge University Press:
- 21 March 2011, J6.4
- Print publication:
- 2001
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- Article
- Export citation