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Low Vacuum Scanning Electron Microscopy, a Novel Technique for Integrated Microscopic Evaluation of Implantable Devices
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
- Published online by Cambridge University Press:
- 06 August 2003, pp. 208-209
- Print publication:
- August 2003
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- Article
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