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Three-Dimensional Imaging of Dislocations and Defects in Materials at Atomic Resolution Using Electron Tomography
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 1062-1063
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- August 2014
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Transmission Electron Microscopy of Coherence and Nanothermodynamic Effects in Graphene Biased In Situ
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 454-455
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- August 2013
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Fabrication of a Lift-Out Grid with Electrical Contacts for Focused Ion Beam Preparation of Lamella for In Situ Transmission Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 458-459
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- August 2013
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Quantitative Electron Diffraction of Graphene: Measurement of Mean-Square Atomic Displacement and Implications for Dark Field Imaging
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1934-1935
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- August 2013
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Creation And Manipulation Of Bubbles In Liquid Water Using A Scanning Transmission Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1102-1103
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- July 2012
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In Situ Transmission Electron Microscopy of Electrochemical Electrode Reconfiguration Processes
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1106-1107
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- July 2012
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Challenges for Electron Tomography of Nanoscale Electrical Devices: Geometry and Beam Damage
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1548-1549
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- July 2011
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