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Design and Testing of a Quadrupole/Octupole C3/C5 Aberration Corrector
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 2130-2131
- Print publication:
- August 2005
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- Article
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Nion UltraSTEM: An Aberration-Corrected STEM for Imaging and Analysis
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1422-1423
- Print publication:
- August 2005
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- Article
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- You have access
- Export citation