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Using Electron Diffraction Techniques, CBED and N-PED to measure Strain with High Precision and High Spatial Resolution
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- Journal:
- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 2209-2210
- Print publication:
- August 2015
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Dislocation Networks Strain Fields Induced By Si Wafer Bonding.
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- Journal:
- MRS Online Proceedings Library Archive / Volume 673 / 2001
- Published online by Cambridge University Press:
- 18 March 2011, P6.9
- Print publication:
- 2001
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Evidence by Hrem of Interfacial Modification Induced by Equilibrium Segregation in GE(S) Bicrystal
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- Journal:
- MRS Online Proceedings Library Archive / Volume 319 / 1993
- Published online by Cambridge University Press:
- 21 February 2011, 417
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- 1993
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