7 results
Thermal Degradation of Tantalum-Nickel Thin Film Couples
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 382 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 389
- Print publication:
- 1995
-
- Article
- Export citation
Interface Reaction Kinetics for Permalloy-Tantalum Thin Film Couples
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 343 / 1994
- Published online by Cambridge University Press:
- 15 February 2011, 211
- Print publication:
- 1994
-
- Article
- Export citation
Grain Boundary Diffusion in NiFe/Ag Bilayer Thin Films
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 343 / 1994
- Published online by Cambridge University Press:
- 15 February 2011, 217
- Print publication:
- 1994
-
- Article
- Export citation
Magnetic Structure Determination for Annealed Ni80Fe20/Ag Multilayers Using Polarized-Neutron Reflectivity
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 376 / 1994
- Published online by Cambridge University Press:
- 22 February 2011, 577
- Print publication:
- 1994
-
- Article
- Export citation
Stress Measurements in Materials for Magnetic Recording
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 308 / 1993
- Published online by Cambridge University Press:
- 15 February 2011, 15
- Print publication:
- 1993
-
- Article
- Export citation
Grain Boundary Diffusion in Co/Cu and Co/Cr Magnetic Thin Films
-
- Journal:
- MRS Online Proceedings Library Archive / Volume 313 / 1993
- Published online by Cambridge University Press:
- 03 September 2012, 205
- Print publication:
- 1993
-
- Article
- Export citation
Characterization of Permalloy Thin Films via Variable Sample Exit Angle Ultrasoft X-ray Fluorescence Spectrometry
-
- Journal:
- Advances in X-ray Analysis / Volume 32 / 1988
- Published online by Cambridge University Press:
- 06 March 2019, pp. 261-268
- Print publication:
- 1988
-
- Article
- Export citation