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Cold-Atom Ion Sources for Focused Ion Beam Applications
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 276-277
- Print publication:
- July 2017
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- Article
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Study of Direct Lithiation of Thin Si Membranes with Spatially-Correlative Low Energy Focused Li Ion Beam and Analytical Electron Microscopy Techniques
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 1556-1557
- Print publication:
- July 2016
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- Article
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