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Rapid Automated Preparation for Serial Block Face Scanning Electron Microscopy
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 1182-1183
- Print publication:
- August 2019
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Three-Dimensional Analysis of Optic Nerve Axons Using a Focused Ion Beam-Based Approach
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- Journal:
- Microscopy Today / Volume 18 / Issue 1 / January 2010
- Published online by Cambridge University Press:
- 28 January 2010, pp. 18-22
- Print publication:
- January 2010
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