1 results
Measurement and numerical analysis of C-V characteristics for normally-on SiCED-JFET
-
- Journal:
- The European Physical Journal - Applied Physics / Volume 66 / Issue 2 / May 2014
- Published online by Cambridge University Press:
- 05 June 2014, 20103
- Print publication:
- May 2014
-
- Article
- Export citation