2 results
Measure of carrier lifetime in nanocrystalline silicon thin films using transmission modulated photoconductive decay
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1245 / 2010
- Published online by Cambridge University Press:
- 01 February 2011, 1245-A16-11
- Print publication:
- 2010
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Defects in Hydrogenated Amorphous Silicon Carbide Alloys using Electron Spin Resonance and Photothermal Deflection Spectroscopy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 1153 / 2009
- Published online by Cambridge University Press:
- 31 January 2011, 1153-A18-05
- Print publication:
- 2009
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- Article
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