2 results
Correlating Atom Probe Tomography with Atomic-Resolved Scanning Transmission Electron Microscopy: Example of Segregation at Silicon Grain Boundaries
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue 2 / April 2017
- Published online by Cambridge University Press:
- 20 February 2017, pp. 291-299
- Print publication:
- April 2017
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Influence of Static Atomic Displacements on Composition Quantification of AlGaN/GaN Heterostructures from HAADF-STEM Images
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- Journal:
- Microscopy and Microanalysis / Volume 20 / Issue 5 / October 2014
- Published online by Cambridge University Press:
- 10 July 2014, pp. 1463-1470
- Print publication:
- October 2014
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- Article
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