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p-Type transparent conducting copper-strontium oxide thin films for optoelectronic devices

Published online by Cambridge University Press:  14 November 2011

H.A. Mohamed*
Affiliation:
Physics Department, Faculty of Science, Sohag University, 82524 Sohag, Egypt Physics Department, Teachers College, King Saud University, 11148 Riyadh, Kingdom of Saudi Arabia
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Abstract

p-Type thin films of copper-strontium oxide (Cu-Sr-O) have been deposited by e-beam evaporation technique on microscopic glass substrates. A study of optical, electrical and structural properties was performed on the thin films, varying temperature of annealing. Amorphous Cu-Sr-O films were obtained at low temperature. Partially polycrystalline films were obtained at high temperature of 550 °C with transparency over 72% at wavelength from 600 to 700 nm in the visible region and 83% in the near infrared region (λ = 1800:2500 nm). The optical band gap was estimated to be ~3.5 eV. The Seebeck coefficient measurements showed that the as-deposited films represented n-type conduction and with annealing temperature these films converted to p-type. The electrical conductivity measurements at room temperature of annealed films at temperature of 550 °C represented the best value about 2 S/cm. The other optical parameters such as refractive index, extinction coefficient, dielectric constant and cutoff wavelength were studied as a function of annealing temperature.

Type
Research Article
Copyright
© EDP Sciences, 2011

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References

Lee, J., Metson, J., Evans, P.J., Kinsey, R., Bhattacharyya, D., Appl. Surf. Sci. 253, 4317 (2007)CrossRef
Akhlesh, G., Compaan, A.D., Appl. Phys. Lett. 85, 684 (2004)
Bamiduro, O., Mundle, H., Konda, R.B., Pradhan, A.K., Appl. Phys. Lett. 90, 252108 (2007)CrossRef
Seager, C.H., McIntyre, D.C., Warren, W.L., Tuttle, B.A., Appl. Phys. Lett. 68, 2660 (1996)CrossRef
Prince, M.W.J., Gross-Holtz, K.O., Muller, G., Cillessen, J.B., Giesbers, J.B., Weening, R.P., Wolf, R.M., Appl. Phys. Lett. 68, 3650 (1996)CrossRef
Kawazoe, H., Yasukawa, M., Hyodo, H., Kurita, M., Yanagi, H., Hosono, H., Nature 389, 939 (1997)CrossRef
Thomas, G., Nature 389, 907 (1997)CrossRef
Yanagi, H., Inoue, S., Ueda, K., Kawazoe, H., Hosono, H., Hamada, N., J. Appl. Phys. 88, 4159 (2000)CrossRef
Nagarajan, R., Draeseke, A.D., Sleight, A.W., Tate, J., J. Appl. Phys. 89, 8022 (2001)CrossRef
Tate, J., Jayaraj, M.K., Draeseke, A.D., Ulbrich, T., Sleight, A.W., Vanaja, K.A., Nagarajan, R., Wager, J.F., Hoffman, R.L., Thin Solid Films 411, 119 (2002)CrossRef
Kingery, W.D., in Kinetics of High Temperature Process, edited by Kingery, W. (MIT Press, Cambridge, MA, 1959), p. 187Google Scholar
Mohamed, H.A., J. Phys. D: Appl. Phys. 40, 4234 (2007)CrossRef
Mohamed, H.A., Optoelectron. Adv. Mater.-Rapid Commun. 3, 693 (2009)
Tanaka, K., Kunioks, A., Sakai, Y., Jpn. J. Appl. Phys. 8, 681 (1969)CrossRef
Kim, H., Horwitz, J., Kim, W., Makinen, A., Kafafi, Z., Chrisey, D., Thin Solid Films 420–421, 539 (2002)CrossRef
Khan Shamshad, A., Al-Hazmi, F.S., Al-Heniti, S., Faidah, A.S., Al-Ghamdi, A.A., Curr. App. Phys. 10, 145 (2010)CrossRef
Khan Shamshad, A., Al-Ghamdi, A.A., Mater. Lett. 63, 1740 (2009)CrossRef
Al-Ghamdi, A.A., Khan Shamshad, A., Physica B 404, 4262 (2009)CrossRef
Nie, X., Wei, S.H., Zhang, S.B., Phys. Rev. B 65, 75111 (2002)CrossRef
Ohta, H., Orita, M., Hirano, M., Yagi, I., Ueda, K., Hosono, H., J. Appl. Phys. 91, 3074 (2002)CrossRef
Knickerbocker, S.A., Kulkarni, A.K., J. Acad. Sci. Technol. A 14, 1709 (1996)
Tauc, J., in Amorphous and Liquid Semiconductors, edited by Tauc, J. (Plenum Press, New York, 1979), p. 159Google Scholar
Reddy, R.R., Rama Gopal, K., Narasimhulu, K., Siva Sankara Reddy, L., Raghavedra Kumar, K., Krishna Reddy, C.V., Ahmed, S.N., Opt. Mater. 31, 209 (2008)CrossRef
Anani, M., Mathieu, C., Lebid, S., Amar, Y., Chama, Z., Abid, H., Comput. Mater. Sci. 41, 570 (2008)CrossRef
Cody, D., Semiconductors and Semimetals. Part B. Optical Properties, vol. 21, (Academic Press, New York, 1984) p. 25Google Scholar
Anders, A., Lim, S.H.N., Yu, K.M., Andersson, J., Rosen, J., McFarland, M., Brown, J., Thin Solid Films 518, 3313 (2010)CrossRef
Roy, B., Perkins, J.D., Kaydanova, T., Young, D.L., Taylor, M., Miedaner, A., Curtis, C., Kleebe, H.-J., Readey, D.W., Ginley, D.S., Thin Solid Films 516, 4093 (2008)CrossRef
Bobeico, E., Varsano, F., Minarini, C., Roca, F., Thin Solid Films 444, 70 (2003)CrossRef
Ni, J., Zhao, X., Zheng, X., Zhao, J., Liu, B., Acta Mater. 57, 278 (2009)CrossRef