Skip to main content Accessibility help
×
Home
Hostname: page-component-79b67bcb76-6j5sx Total loading time: 0.19 Render date: 2021-05-14T02:46:10.147Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "metricsAbstractViews": false, "figures": false, "newCiteModal": false, "newCitedByModal": true, "newEcommerce": true }

Etching, micro hardness and laser damage threshold studies of a nonlinear optical material L-valine

Published online by Cambridge University Press:  23 March 2012

M. Anbuchezhiyan
Affiliation:
Department of Physics, Valliammai Engineering College, SRM Nagar, Kattankulathur, Chennai 603203, India
S. Ponnusamy
Affiliation:
Centre for Material Science and Nano Devices, Department of Physics, SRM University, Kattankulathur, Chennai 603203, India
C. Muthamizhchelvan
Affiliation:
Centre for Material Science and Nano Devices, Department of Physics, SRM University, Kattankulathur, Chennai 603203, India
C.C. Kanakam
Affiliation:
Department of Chemistry, Valliammai Engineering College, SRM Nagar, Kattankulathur, Chennai 603203, India
S.P. Singh
Affiliation:
Department of Physics and Meteorology, Indian Institute of Technology, Kharagpur 721302, India
P.K. Pal
Affiliation:
Department of Physics and Meteorology, Indian Institute of Technology, Kharagpur 721302, India
P.K. Datta
Affiliation:
Department of Physics and Meteorology, Indian Institute of Technology, Kharagpur 721302, India
Corresponding
E-mail address:
Get access

Abstract

A nonlinear optical crystal of L-valine was grown from an aqueous solution containing a small amount of phosphoric acid by the slow evaporation method. The grown crystal was characterized by a single crystal X-ray diffraction to determine the unit cell parameters. The powder X-ray diffraction analysis also confirmed the lattice parameters to be a = 9.6687(7) Å, b = 5.2709(4) Å, c = 12.0371(10) Å and β = 90.805(4)°. The results of the Inductively Coupled Plasma Optical Emission Spectrometry (ICPOES) indicate the presence of a small amount of phosphorus in the grown crystal. The Vickers micro hardness test was performed to study the mechanical strength of the crystals. Chemical etching studies were carried out to analyze the dislocation structure. The laser damaged threshold of the grown crystal was measured to be 11.11 GW/cm2 for 10 ns pulse at 1064 nm, which is higher than that of the standard nonlinear optical crystals like KDP. Second harmonic generation of the grown crystals was also 1.44 times that of KDP.

Type
Research Article
Copyright
© EDP Sciences, 2012

Access options

Get access to the full version of this content by using one of the access options below.

References

Nalwa, H., Miyata, S., in Nonlinear Optics of Organic Molecules and Polymers (CRC Press, New York, 1997)Google Scholar
Manivannan, S., Dhanuskodi, S., J. Cryst. Growth 257, 305 (2003)CrossRef
Dmitriev, V.G., Gurzadyan, G.G, Nicogosyan, D.N., Hand Book of Nonlinear Optical Crystals (Springer-Verlag, New York, 1999)CrossRefGoogle Scholar
Razzetti, C., Ardoino, M., Zanotti, L., Zha, M., Paorici, C., Cryst. Res. Technol. 37, 456 (2002)3.0.CO;2-M>CrossRef
Britto Dhas, S.A.M, Natarajan, S., Mater. Lett. 62, 2633 (2008)CrossRef
Narayan Bhat, M., Dharmaprakash, S.M., J.Cryst. Growth 236, 376 (2002)CrossRef
Ramesh Kumar, G., Gokul Raj, S., Sankar, R., Mohan, R., Pandi, S., Jayavel, R., J. Cryst. Growth 267, 213 (2004)CrossRef
Parimaladevi, R., Sekar, C., Spectrochiml. Acta A 76, 490 (2010)CrossRef
Moitra, S., Kar, T., Cryst. Res. Technol. 45, 70 (2010)CrossRef
Torii, K., Iitaka, Y., Acta Cryst. B26, 1317 (1970)CrossRef
Sangwal, K., Cryst. Res. Technol. 44, 1019 (2009)CrossRef
Mukerji, S., Kar, T., J. Cryst. Growth 200, 543 (1999)CrossRef
Mukerji, S., Kar, T., J. Cryst. Growth 204, 341 (1999)CrossRef
Kurtz, S.K., Perry, T.T., J. Appl. Phys. 39, 3798 (1968)CrossRef
Anbuchezhiyan, M., Ponnusamy, S., Singh, S.P., Pal, P.K., Datta, P.K., Muthamizhchelvan, C., Cryst. Res. Technol. 45, 497 (2010)CrossRef
Martin Britto Dhas, S.A., Natarajan, S., Cryst. Res. Technol. 42, 471 (2007)CrossRef
Kumar, T. K., Selvaraj, R.S., Janarthanan, S., Rajan, Y.C., Selvakumar, S., Pandi, S., Selvakumar, M.S., Anand, D., Eur. Phys. J. Appl. Phys. 50, 20401 (2010)CrossRef

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Etching, micro hardness and laser damage threshold studies of a nonlinear optical material L-valine
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

Etching, micro hardness and laser damage threshold studies of a nonlinear optical material L-valine
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

Etching, micro hardness and laser damage threshold studies of a nonlinear optical material L-valine
Available formats
×
×

Reply to: Submit a response


Your details


Conflicting interests

Do you have any conflicting interests? *