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Active spectro-polarimetric imaging: signature modeling, imaging demonstrator and target detection

Published online by Cambridge University Press:  28 March 2008

M. Alouini*
Thales Research & Technology - France, RD 128, 91767 Palaiseau Cedex, France
F. Goudail
Laboratoire Charles Fabry de l'Institut d'Optique, CNRS, Univ Paris-Sud, Campus Polytechnique, RD 128, 91127 Palaiseau, France
N. Roux
Physics and Image Processing Group/Fresnel Institute, Domaine Universitaire de Saint-Jérôme, 13397 Marseille Cedex 20, France
L. Le Hors
Thales Oprtonics Thales Optronique SA, rue Guynemer, BP 55, 78283 Guyancourt Cedex, France
P. Hartemann
Thales Research & Technology - France, RD 128, 91767 Palaiseau Cedex, France
S. Breugnot
Thales Oprtonics Thales Optronique SA, rue Guynemer, BP 55, 78283 Guyancourt Cedex, France
D. Dolfi
Thales Research & Technology - France, RD 128, 91767 Palaiseau Cedex, France
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We report on the synthesis of our work on the analysis of active spectro-polarimetric imaging concept of real-world scenes. These synthesis extend from the investigation of depolarization mechanisms up to image analysis and processing. We show in particular that depolarization effects are wavelength dependent and strongly correlated with light absorption of materials. Multi-wavelength images of degree of polarization are recorded and analyzed, evidencing that the polarimetric image must be interpreted in conjunction with its counterpart intensity image in order to extract, the most relevant information from the scene. For real field operation, the noise characteristics of polarimetric images are also investigated under coherent laser illumination. The potential increase of target detection performance brought by properly processing the active polarimetric image is illustrated on a very low contrast scene.


Research Article
© EDP Sciences, 2008

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Farlow, C.A., Chenault, D.B., Pezzaniti, J.L., Spradley, K.D., Gulley, M.G., in Polarization Analysis, Measurement and Remote Sensing IV, edited by D.H. Goldstein, D.B. Chenault, W.G. Egan, M.J. Duggin, Proc. SPIE 4481, 118 (2002) CrossRef
Sadjadi, F.A., Chun, C.S., in Automatic Target Recognition XI, edited by A. Firooz, A. Sadjadi, Proc. SPIE 4379, 144 (2001) CrossRef
Johnson, B., Joseph, R., Nischan, M., Newbury, A., Kerekes, J., Barclay, H., Willard, B., Zayhowski, J.J., in Detection and Remediation Technologies for Mines and Minelike Targets IV, edited by A.C. Dubey, J.F. Harvey, J.T. Broach, R.E. Dugan, Proc. SPIE 3710, 144 (1999) CrossRef
Tyo, J.S., Turner, Th. S., in Imaging Spectrometry V, edited by M.R. Descour, S.S. Shen, Proc. SPIE 3753, 214 (1999) CrossRef
Le Hors, L., Hartemann, P., Breugnot, S., in Laser Radar Technology and Applications V, edited by G.W. Kamerman, U.N. Singh, C.H. Werner, V.V. Molebny, Proc. SPIE 4035, 380 (2000) CrossRef
Le Hors, L., Hartemann, P., Dolfi, D., Breugnot, S., in Targets and Backgrounds VII: Characterization and Representation, edited by W.R. Watkins, D. Clement, W.R. Reynolds, Proc. SPIE 4370, 94 (2001) CrossRef
Alouini, M., Goudail, F., Refregier, P., Grisard, A., Lallier, E., Dolfi, D., in Polarization: Measurement, Analysis, Remote Sensing VI, edited by D.H. Goldstein, D.B. Chenault, Proc. SPIE 4432, 133 (2004) CrossRef
Denes, J.L., Gottlieb, M.S., Kaminsky, B., Huber, D.F., in 26 th AIPR Workshop: Exploiting New Image Sources and Sensors, edited by J.M. Selander, Proc. SPIE 3240, 8 (1998) CrossRef
E. Collet, Polarized Light (Marcel Deckker, New York, 1993)
Sh.Y. Lu, R.A. Chipman, J. Opt. Soc. Am. A 13, 1106 (1996) CrossRef
Ph. Eliès, B. Le Jeune, M. Floc'h, J. Lotrian, in Advances in Laser Remote Sensing for Terrestrial and Oceanographic Applications, edited by R.M. Narayanan, J.E. Kalshoven, Proc. SPIE 3059, 174 (1997) CrossRef
S. Huard, Polarization of light (Ed. Wiley, 1997)
Brown, G.C., Celli, V., Haller, M., Marvin, A., Surf. Sci. 136, 381 (1984) CrossRef
Soubret, A., Berginc, G., Bourrely, C., Phys. Rev. B 63, 245411 (2001) CrossRef
C. Brosseau, Polarized Light (Ed. John Wiley & Sons, 1998)
Stagg, B.J., Charalampopoulos, T.T., Appl. Opt. 30, 4113 (1991) CrossRef
Mendez, E.R., O'Donnell, K.A., Opt. Com. 61, 91 (1987) CrossRef
Eliès, P., Le Jeune, B., Marie, J.P., Cariou, J., Lotrian, J., in Optical Inspection and Micromeasurements, edited by C. Gorecki, Proc. SPIE 2782, 719 (1996) CrossRef
Rennel, C., Rigdahl, M., Colloid Polym. Sci. 272, 1111 (1994) CrossRef
Kubelka, P., Munk, F., Z. Tech. Phys. 12, 593 (1931)
Phillips, D.G., Billmeyer Jr, F.W.., J. Coating Tech. 122, 30 (1976)
Gunde, M.K., Orel, Z.C., Appl. Opt. 39, 622 (2000) CrossRef
P. Callet, Ph.D. thesis, École Centrale de Paris (1993)
Ellis, J., Dogariu, A., Phys. Rev. Lett. 95, 203905 (2005) CrossRef
Bicout, D., Brosseau, C., J. Phys. I France 2, 2047 (1992) CrossRef
Zimnyakov, D.A., Tuchin, V.V., Yodh, A.G., J. Biomed. Opt. 4, 157 (1999) CrossRef
Dogariu, A., Kutsche, C., Likamwa, P., Boreman, G., Moudgil, B., Opt. Lett. 22, 585 (1997) CrossRef
Vreeker, R., Van Albada, M.P., Spril, R., Lagendijk, A., Opt. Com. 70, 365 (1989) CrossRef
Bicout, D., Brosseau, C., Martinez, A.S., Schmitt, J.M., Phys. Rev. E 49, 1767 (1994) CrossRef
A. Ishimaru, Wave propagation and scattering in random media (Wiley-IEEE Press, 1999)
J.W. Goodman, Statistical Optics (John Wiley & Sons, 1985)
F. Goudail, P. Réfrégier, Statistical image processing techniques for noisy images: an application oriented approach (Kluwer, 2004)
S.M. Kay, Fundamentals of statistical signal processing - Vol. 2: Detection (Prentice-Hall, 1998), pp. 186–247