In many ways, studies of materials and minerals by powder-diffraction techniques are complementary, with techniques honed in one field equally applicable to the other. Many of the example techniques described within this paper were developed for analysis of functional materials and subsequently applied to minerals. However, in a couple of cases, the study of new minerals was the initiation into techniques later used in materials-based studies. Hopefully they will show that the study of new minerals structures can provide opportunities to add new methodologies and approaches to future problems. In keeping with the Australian X-ray Analytical Association many of the examples have an Australian connection, the materials ranging from organics to battery materials.

The crystal structure of SiAl5O2N5 was characterized by laboratory X-ray powder diffraction (CuKα1). The title compound is hexagonal with space group P63/mmc (Z = 2). The unit-cell dimensions are a = 0.303153(3) nm, c = 3.28153(3) nm, and V = 0.261178(5)  nm3. The initial structural model was successfully derived by the direct methods and further refined by the Rietveld method. The final structural model showed the positional disordering of two of the four (Si,Al) sites. The maximum-entropy method-based pattern fitting (MPF) method was used to confirm the validity of the split-atom model, in which conventional structure bias caused by assuming intensity partitioning was minimized. The reliability indices calculated from the MPF were Rwp = 5.00%, S (=Rwp/Re) = 1.25, Rp = 3.76%, RB = 1.26%, and RF = 0.90%. The disordered crystal structure was successfully described by overlapping four types of domains with ordered atom arrangements. The distribution of atomic positions in each of the domains can be achieved in the space group P63mc. Two of the four types of domains are related by a pseudo-symmetry inversion, and the two remaining domains also have each other the inversion pseudo-symmetry.

The General Structure and Analysis Software II (GSAS-II) package is an all-new crystallographic analysis package written to replace and extend the capabilities of the universal and widely used GSAS and EXPGUI packages. GSAS-II was described in a 2013 article, but considerable work has been completed since then. This paper describes the advances, which include: rigid body fitting and structure solution modules; improved treatment for parametric refinements and equation of state fitting; and small-angle scattering data reduction and analysis. GSAS-II offers versatile and extensible modules for import and export of data and results. Capabilities are provided for users to select any version of the code. Code documentation has reached 150 pages and 17 web-tutorials are offered.

Synchrotron X-ray diffraction images are increasingly used to characterize crystallographic preferred orientation distributions (texture) of fine-grained polyphase materials. Diffraction images can be analyzed quantitatively with the Rietveld method as implemented in the software package Materials Analysis Using Diffraction. Here we describe the analysis procedure for diffraction images collected with high energy X-rays for a complex, multiphase shale, and for those collected in situ in diamond anvil cells at high pressure and anisotropic stress.

We report here the fabrication and characterization of ultra-long AlN whiskers by physical vapor transport method. The obtained whiskers are 1–3 µm in diameter and up to millimeters in length. The whiskers grow along the [0001] crystallographic direction and are well crystallized. They exhibit a strong ultraviolet emission at 345 nm, the shortest wavelength reported in AlN whiskers or nanowires. Our results indicate that these large scales of AlN whiskers are less contaminated by oxygen and other impurities compared with the previously reported ones, which may find wide applications in fabricating ultraviolet optoelectronic devices.

The crystal structure of a morimotoite garnet, ideally Ca3(Ti4+Fe2+)Si3O12, from the Ice River alkaline complex, British Columbia, Canada was refined by the Rietveld method, space group $Ia\overline 3 d$, and monochromatic synchrotron high-resolution powder X-ray diffraction (HRPXRD) data. Electron-microprobe analysis indicates a homogeneous sample with a formula {Ca2.91Mg0.05Mn2+0.03}Σ3[Ti1.09Fe3+0.46Fe2+0.37Mg0.08]Σ2(Si2.36Fe3+0.51Al0.14)Σ3O12. The HRPXRD data show a two-phase intergrowth. The reduced χ2 and overall R(F2) Rietveld refinement values are 1.572 and 0.0544, respectively. The weight percentage, unit-cell parameter (Å), distances (Å), and site occupancy factors (sofs) for phase-1 are as follows: 76.5(1)%, a = 12.156 98(1) Å, average <Ca–O> = 2.4383, Ti–O = 2.011(1), Si–O = 1.693(1) Å, Ca(sof) = 0.943(2), Ti(sof) = 0.966(2), and Si(sof) = 1.095(3). The corresponding values for phase-2 are 23.5(1)%, a = 12.160 67(2) Å, average <Ca–O> = 2.452, Ti–O = 1.988(3), Si–O = 1.704(3) Å, Ca(sof) = 1.063(7), Ti(sof) = 1.187(7), and Si(sof) = 1.220(8). The two phases cause strain that arises from structural mismatch and gives rise to low optical anisotropy. Because the two phases are structurally quite similar, a refinement using a single-phase model with anisotropic displacement parameters shows no unusual displacement ellipsoid for the O atom that requires a “split O-atom position”, as was done in previous studies.

The crystal structure of one isotropic [(1) Brazil] and three birefringent spessartine samples [(2) California, (3) Tanzania, and (4) Colorado] were refined using the Rietveld method, cubic space group $Ia\overline 3 d$, and monochromatic synchrotron high-resolution powder X-ray diffraction (HRPXRD) data. The results of electron-microprobe analysis (EMPA) indicate homogeneous compositions, in terms of end-members, as follows: (1) Sps54Alm43, (2) Sps90Alm8, (3) Sps64Prp27Grs3, and (4) Sps73Alm19. Their crystal structures were modeled well as indicated by the Rietveld refinement statistics where the reduced χ2 and overall R (F2) values for each sample are: (1) 1.395 and 0.0329, (2) 1.082 and 0.0354, (3) 1.025 and 0.0347, and (4) 1.016 and 0.0413. Two cubic phases occur in samples 2–4, and a single cubic phase occurs in sample-1. The dominant cubic phase-1 with locality, weight fraction (%), unit-cell parameter (Å), distances (Å), and site occupancy factors (sofs) are as follows: (1) Brazil: 100%, a = 11.581 54 (1), average <Mn–O> = 2.3156, Al–O = 1.8949 (3), Si–O = 1.6376 (3) Å, Mn(sof) = 0.961(1), Al(sof) = 0.945(1), and Si(sof) = 0.936(1); (2) California: 96.67(7)%, a = 11.613 32(1), average <Mn–O> = 2.3249, Al–O = 1.8956 (4), Si–O = 1.6416 (4) Å, Mn(sof) = 0.951(1), Al(sof) = 0.946(1), and Si(sof) = 0.927(1); (3) Tanzania: 69.46(6)%, a = 11.598 45(1), average <Mn–O> = 2.3199, Al–O = 1.8964 (5), Si–O = 1.6398 (5) Å, Mn(sof) = 0.808(1), Al(sof) = 0.942(1), and Si(sof) = 0.922(1); and (4) Colorado: 98.58(6)%, a = 11.606 89(1), average <Mn–O> = 2.3204, Al-O = 1.8948 (6), Si–O = 1.6450 (6) Å, Mn(sof) = 0.949(1), Al(sof) = 0.967(2), and Si(sof) = 0.913(2). The two-phase intergrowth causes strain that arises from mismatch of the structural parameters and gives rise to strain-induced birefringence.

The monoclinic-to-tetragonal phase transition (~70 °C) in vanadium dioxide (VO2) strongly impacts the infrared properties, which enables its use in applications such as smart window devices. Synthesis of VO2 can be challenging due to the variability of vanadium oxide phases that may be formed. We have employed high-temperature X-ray diffraction (HTXRD) to monitor the reaction process of vanadium oxide precursor powders to form the desired tetragonal VO2 phase. Single-phase tetragonal VO2 was formed within 30 min at 420 °C in flowing N2 gas (~50 ppm O2). The monoclinic-to-tetragonal phase transformation was observed via HTXRD at ~70 °C with the typical ~10 °C hysteresis (i.e. approached from above or below the transition).

There is a growing need for environmental scientists, geoscientists, and analysts skilled in the use of X-ray fluorescence spectrometry and X-ray diffractometry. The challenge for educators is how to inspire, teach, and make the next generation of professional X-ray users and analysts ready for employment. In this paper, we present vignettes from teaching applications of X-ray analytical techniques at three scaffolded levels, from senior high school students, undergraduate science students, to postgraduate researchers. At each of these levels the pedagogical complexity increases, from simple data use at high school, to observing how data are generated and being able to constrain analytical uncertainty at the undergraduate level, to generating high-quality data at the postgraduate level. In all cases, transportable equipment is used in on-site analytical programs to inform the experimental design, level of sampling required, and research outcomes.

Some improvements have been introduced in the current computer program for powder diffraction pattern indexing using the dichotomy algorithm. The resulting version, DICVOL14, includes optimizations and extension of scanning limits for triclinic cases, a detailed review of the input data from the indexing solutions, cell centering tests and a new approach for zero-point offset evaluation. The performance of the new version is illustrated with many examples, such as triclinic cases with long axes and dominant zones. Some important parameters in pattern indexing based on the dichotomy algorithm are commented upon, e.g. the precision of data and spurious lines.

HighScore with the Plus option (HighScore Plus) is the commercial powder diffraction analysis software from PANalytical. It has been in constant development over the last 13 years and has evolved into a very complete and mature product. In this paper, we present a brief overview of the suite focusing on the latest additions and its user-friendliness. The introduction briefly touches some basic ideas behind HighScore and the Plus option.

Developments in X-ray analysis, and advances in scientific research, have dramatically influenced the types of data now considered suitable for inclusion in the Powder Diffraction FileTM (PDF®). Initially, the PDF was geared towards the identification of unknown crystalline materials by comparison of d-spacings and peak intensities. Today, the International Centre for Diffraction Data (ICDD) maintains and continuously enhances the quality and content of the PDF database to better provide customers and scientists with a comprehensive reference source that supports their needs, and interests. The events that initially led to the inclusion of crystalline polymer data to the PDF have recently been amended to also encompass semi-crystalline and amorphous polymeric materials as well. This paper discusses the resultant updates being made to the PDF in support of this new data form, and also highlights several features and benefits of providing this data to PDF users.