6745 results in Powder Diffraction & past titles
Use of the Crystal Data File on CD-ROM
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- Advances in X-ray Analysis / Volume 32 / 1988
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- 06 March 2019, pp. 539-544
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- 1988
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Low Level Iodine Detection by TXRF Spectrometry
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- Advances in X-ray Analysis / Volume 32 / 1988
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- 06 March 2019, pp. 251-253
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- 1988
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Micro X-Ray Fluorescence Analysis with Synchrotron Radiation
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- Advances in X-ray Analysis / Volume 32 / 1988
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- 06 March 2019, pp. 141-147
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- 1988
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On-Line X-Ray Fluorescence Spectrometer for Coating Thickness Measurements
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- Advances in X-ray Analysis / Volume 32 / 1988
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- 06 March 2019, pp. 21-30
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- 1988
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X-Ray Diffraction Using Synchrotron Radiation - A Catalysis Perspective
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- Advances in X-ray Analysis / Volume 32 / 1988
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- 06 March 2019, pp. 9-20
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- 1988
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Development of Instrument Control Software for the SRS/300 Spectrometer on a VAX/730 Computer Running the VMS Operating System
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- Advances in X-ray Analysis / Volume 32 / 1988
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- 06 March 2019, pp. 121-129
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- 1988
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Quantitative Analysis of Arsenic Element in a Trace of Water Using Total Reflection X-ray Fluorescence Spectrometry
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- Advances in X-ray Analysis / Volume 32 / 1988
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- 06 March 2019, pp. 197-204
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- 1988
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X-Ray Microprobe Studies Using Multilayer Focussing Optics
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- Advances in X-ray Analysis / Volume 32 / 1988
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- 06 March 2019, pp. 149-153
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- 1988
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Preface
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- Advances in X-ray Analysis / Volume 32 / 1988
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- 06 March 2019, pp. vii-xiii
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- 1988
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Fast Thickness Measurement of Thin Crystalline Layers by Relative Intensities in XRPD Method
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- Advances in X-ray Analysis / Volume 32 / 1988
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- 06 March 2019, pp. 293-301
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- 1988
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Impurity Analysis of Silicon Wafers by Total Reflection X-ray Fluorescence Analysis
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- Advances in X-ray Analysis / Volume 32 / 1988
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- 06 March 2019, pp. 205-210
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- 1988
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Simultaneous Thermal and Structural Measurements of Oriented Polymers by DSC/XRD Using an Area Detector
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- Advances in X-ray Analysis / Volume 32 / 1988
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- 06 March 2019, pp. 617-623
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- 1988
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Resolution Enhancement for Cu Kα Emission of Y-Ba-Cu-O Compounds
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- Advances in X-ray Analysis / Volume 32 / 1988
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- 06 March 2019, pp. 155-165
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- 1988
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Application of a New Solid State X-Ray Camera to Stress Measurement
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- Advances in X-ray Analysis / Volume 32 / 1988
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- 06 March 2019, pp. 407-413
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- 1988
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Taking into Account the Texture Effect in the Measurement of Residual Stresses by Using the Vector Method of Texture Analysis
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- Advances in X-ray Analysis / Volume 32 / 1988
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- 06 March 2019, pp. 423-428
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- 1988
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Modern Alloy Analysis and Identification with a Portable X-ray Analyzer
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- Advances in X-ray Analysis / Volume 32 / 1988
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- 06 March 2019, pp. 239-250
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- 1988
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Application of Fundamental Parameter Software to On-Line XRF Analysis
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- Advances in X-ray Analysis / Volume 32 / 1988
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- 06 March 2019, pp. 39-44
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- 1988
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Microtomography Detector Design: It's Not Just Resolution
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- Advances in X-ray Analysis / Volume 32 / 1988
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- 06 March 2019, pp. 641-650
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- 1988
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A Reference Database Retrieval System: Information as a Tool to Assist in XRD Phase Identification
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- Advances in X-ray Analysis / Volume 32 / 1988
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- 06 March 2019, pp. 545-550
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- 1988
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Mechanically-Induced Phase Transformations in Plutonium Alloys
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- Advances in X-ray Analysis / Volume 32 / 1988
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- 06 March 2019, pp. 577-584
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- 1988
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