6745 results in Powder Diffraction & past titles
Stress Analysis of Thin-Film SmS Using a Seemann- Bohlin Diffractometer
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 153-159
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- 1989
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Foreword
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. v-vi
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- 1989
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Design of High Performance Soft X-ray Windows
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 615-622
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- 1989
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Strain and Particle Size of Palladium Metal Powders by Time-of-Flight Neutron Diffraction
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 403-407
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- 1989
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Crystal Chemistry and Phase Equilibria of the BaO-R2O3-CuO Systems
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 453-465
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- 1989
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Structure Refinements in Chemistry and Physics. A Comparative Study Using the Rietveld and the Two- Step Method
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 261-268
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- 1989
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XRD Acquisition Parameters for Detection of Weak Peaks
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 313-318
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- 1989
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Qualitative XRF Analysis with Pattern Recognition
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 603-613
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- 1989
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Analytical Errors from Electronic Instability in the Counting Chain of a Wavelength-Dispersive XRF Spectrometer
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 549-552
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- 1989
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The Comparison of Several Standard Materials and Techniques for the Warren-Averbach Determination of Microstructure Characteristics of Calcium Hydroxide Sorbent Materials
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- Advances in X-ray Analysis / Volume 33 / 1989
- Published online by Cambridge University Press:
- 06 March 2019, pp. 383-388
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- 1989
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XRF Macroprobe Analysis of Geologic Materials
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 593-601
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- 1989
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Characterization of Structural Inhomogeneities in GaAs/AIGaAs Superlattices
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 67-74
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- 1989
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PDX volume 33 Cover and Front matter
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, p. f1
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- 1989
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Application of Multi-Layer Thin Film Analysis by X-ray Spectrometry Using the Fundamental Parameter Method
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 225-235
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- 1989
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The Concept of Pathlength Distributions Applied to Fundamental Parameter Approach
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 499-508
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- 1989
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XRD Characterization of Titanium/Copper Thin Films Heat Treated in Vacuum and Hydrogen
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 177-187
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- 1989
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X-ray Diffraction of Plasma Nitrided Ti-6AI-4V
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 129-135
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- 1989
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X-ray Analysis of the Structure of Wholly Aromatic Copolyamides and Copolyester Carbonates
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 423-432
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- 1989
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X-ray Line Broadening Analysis of Tl-Superconducting Films
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 145-151
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- 1989
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An Artificial Intelligence System for XRF Data on a Personal Computer
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- Advances in X-ray Analysis / Volume 33 / 1989
- Published online by Cambridge University Press:
- 06 March 2019, pp. 531-536
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- 1989
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