6745 results in Powder Diffraction & past titles
Residual Stress Distribution of Ceramic-Metal Joint
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 353-362
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- 1989
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Time-Resolved X-ray Stress Measurement During Cyclic Loading
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 335-340
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- 1989
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X-ray Characterisation of Residual Surface Strains after Polishing of Silicon Wafers
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 55-60
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- 1989
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XRFPC: A Program and Data Base for XRF Computations
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 567-572
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- 1989
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Alumina Characterization by XRF
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 685-690
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- 1989
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Study of Thin Films and Multilayers using Energy-Dispersive Diffraction of Synchrotron Radiation
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 101-107
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- 1989
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Near-Surface Chemical Characterization Using Grazing Incidence X-ray Fluorescence
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 205-211
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- 1989
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The Importance of Consistent 1/d Scans in Determining Size and Strain by Powder Diffraction Profile Analysis
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 373-381
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- 1989
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Preface
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. vii-xi
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- 1989
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X-ray Examination of Fracture Surfaces of Silicon Nitride Ceramics
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 319-326
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- 1989
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The Optimization of Step Size While Collecting a Digitized Diffraction Pattern at a Constant Total Scan Time
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 305-311
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- 1989
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A Compact On-Line XRF Analyzer for Chemical and Petrochemical Processes
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 585-591
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- 1989
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Presentation of the 1989 Barrett Award to Jerome B. Cohen
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, p. xiii
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- 1989
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Standard Database Format for the Dissemination and Storage of Diffraction Data - Task Group Progress Report on JCAMP-DX
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 417-422
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- 1989
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X-ray Residual Stress Measurement on Fracture Surface of Stress Corrosion Cracking
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 327-334
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- 1989
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Problems in the Derivation of d-Values from Experimental Digital XRD Patterns
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 285-293
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- 1989
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The Determination of Elemental Composition, Thickness and Crystalline Phases in Single and Multi-Layer Thin Films
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 197-204
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- 1989
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Fundamental Parameter-Based X-ray Fluorescence Analysis of Thin and Multilayer Samples
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 237-245
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- 1989
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Measurement of Relaxation in Strained Layer Semiconductor Structures
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 61-66
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- 1989
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X-ray Topography of Surface Layers and Epitaxial Films
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 13-23
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- 1989
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