6745 results in Powder Diffraction & past titles
X-ray Topography and TEM Study of Crystal Defect Propagation in Epitaxially Grown AIGaAs Layers on GaAs(001)
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- Advances in X-ray Analysis / Volume 34 / 1990
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- 06 March 2019, pp. 507-517
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- 1990
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MATCHDB - A Program for the Identification of Phases Using a Digitized Diffraction-Pattern Database
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- Advances in X-ray Analysis / Volume 34 / 1990
- Published online by Cambridge University Press:
- 06 March 2019, pp. 377-385
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- 1990
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A Review of the Relative Merits of Low Powered WDXRF and EDXRF Spectrometers for Routine Quantitative Analysis
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- Advances in X-ray Analysis / Volume 34 / 1990
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- 06 March 2019, pp. 193-199
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- 1990
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Subject Index
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- Advances in X-ray Analysis / Volume 34 / 1990
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- 18 October 2019, p. 733
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- 1990
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Requirement Analysis and Preliminary Design for Energy Dispersive X-ray Fluorescence Analysis Software
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- Advances in X-ray Analysis / Volume 34 / 1990
- Published online by Cambridge University Press:
- 06 March 2019, pp. 149-156
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- 1990
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X-ray Fluorescence and Fire-Assay Collection: Useful Partners in the Determination of the Platinum-Group Elements
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- Advances in X-ray Analysis / Volume 34 / 1990
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- 06 March 2019, pp. 277-283
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- 1990
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A Method for X-ray Stress Analysis of Thin Films and Its Application to Zinc-Nickel-Alloy Electroplated Steel
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- Advances in X-ray Analysis / Volume 34 / 1990
- Published online by Cambridge University Press:
- 06 March 2019, pp. 699-709
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- 1990
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X-ray Diffraction Analysis of Fly Ash. II. Results*
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- Advances in X-ray Analysis / Volume 34 / 1990
- Published online by Cambridge University Press:
- 06 March 2019, pp. 387-394
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- 1990
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Strategies for Preferred Orientation Corrections in Xray Powder Diffraction Using Line Intensity Ratios
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- Advances in X-ray Analysis / Volume 34 / 1990
- Published online by Cambridge University Press:
- 06 March 2019, pp. 409-415
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- 1990
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Grazing Incidence X-ray Fluorescence Analysis with Monochromatic Radiation
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- Advances in X-ray Analysis / Volume 34 / 1990
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- 06 March 2019, pp. 71-80
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- 1990
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Oxygen Concentration Determination in Silicon Single Crystals by Precision Lattice Parameter Measurement
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- Advances in X-ray Analysis / Volume 34 / 1990
- Published online by Cambridge University Press:
- 06 March 2019, pp. 577-586
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- 1990
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Advances in Boron Measurement with Wavelength Dispersive XRF
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- Advances in X-ray Analysis / Volume 34 / 1990
- Published online by Cambridge University Press:
- 06 March 2019, pp. 131-137
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- 1990
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The Effect of Satellite Lines from the X-ray Source on X-ray Diffraction Peaks
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- Advances in X-ray Analysis / Volume 34 / 1990
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- 06 March 2019, pp. 501-506
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- 1990
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Residual Stress Analysis of Silicon Nitride to Carbon Steel Joint
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- Advances in X-ray Analysis / Volume 34 / 1990
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- 06 March 2019, pp. 661-668
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- 1990
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Evaluation of the X-ray Response of a Position-Sensitive Microstrip Detector with an Integrated Readout Chip
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- Advances in X-ray Analysis / Volume 34 / 1990
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- 06 March 2019, pp. 337-347
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- 1990
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Practical Application for the Use of Statistics to Establish Quality Control and Implement Quality Assurance in X-ray Fluorescence
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- Advances in X-ray Analysis / Volume 34 / 1990
- Published online by Cambridge University Press:
- 06 March 2019, pp. 163-167
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- 1990
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Lineshape Analysis of X-ray Diffraction Profiles: Polyethylene and Model Copolymers
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- Advances in X-ray Analysis / Volume 34 / 1990
- Published online by Cambridge University Press:
- 06 March 2019, pp. 519-529
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- 1990
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Determination of Lattice Parameter and Strain of ϒ' Phases in Nickel-Base Superalloys by Synchrotron Radiation Parallel Beam Diffractometry
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- Advances in X-ray Analysis / Volume 34 / 1990
- Published online by Cambridge University Press:
- 06 March 2019, pp. 493-499
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- 1990
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Trace Analysis Using EDS: Applications to Thin-Film and Heterogeneous Samples
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- Advances in X-ray Analysis / Volume 34 / 1990
- Published online by Cambridge University Press:
- 06 March 2019, pp. 57-70
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- 1990
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Imaging XPS. A Contribution to 3D X-ray Analysis
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- Advances in X-ray Analysis / Volume 34 / 1990
- Published online by Cambridge University Press:
- 06 March 2019, pp. 201-211
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- 1990
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