6745 results in Powder Diffraction & past titles
Characterization of Near Surface Layers by Means of Total Reflection X-Ray Fluorescence Spectrometry
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- Advances in X-ray Analysis / Volume 35 / Issue B / 1991
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- 06 March 2019, pp. 941-946
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- 1991
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Formalism for the Evaluation of Pseudo-Macro Stress Fields σ33(z) from Q-AND ψ-Mode Diffraction Experiments Performed with Synchrotron Radiation
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- Advances in X-ray Analysis / Volume 35 / Issue A / 1991
- Published online by Cambridge University Press:
- 06 March 2019, pp. 481-487
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- 1991
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Particle Statistics and Whole-Pattern Methods in Quantitative X-Ray Powder Diffraction Analysis
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- Advances in X-ray Analysis / Volume 35 / Issue A / 1991
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- 06 March 2019, pp. 1-15
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- 1991
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Measurement of Macrosegregations of Steels by X-Ray Microfluorescence
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- Advances in X-ray Analysis / Volume 35 / Issue B / 1991
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- 06 March 2019, pp. 1301-1306
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- 1991
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Oxidation/Reduction Melting Equilibria in the System BaO-½Y2O3-CuOx II. Powder X-Ray Analysis
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- Advances in X-ray Analysis / Volume 35 / Issue A / 1991
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- 06 March 2019, pp. 633-639
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- 1991
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Dependence of Stress Constant on Microstructure of Quenched and Tempered Steels in X-Ray Stress Measurement
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- Advances in X-ray Analysis / Volume 35 / Issue A / 1991
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- 06 March 2019, pp. 519-525
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- 1991
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Depth Profiling of Ceramic Specimens using Multi-Wavelength X-Ray Bragg-Brentano Diffraction Data with Particular Reference to Zirconia-Aluminas
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- Advances in X-ray Analysis / Volume 35 / Issue A / 1991
- Published online by Cambridge University Press:
- 06 March 2019, pp. 169-175
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- 1991
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X-Ray Photoelectron and Fluorescence Spectra of Several Zirconium Oxide Compounds
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- Advances in X-ray Analysis / Volume 35 / Issue B / 1991
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- 06 March 2019, pp. 851-856
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- 1991
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A Study on the Misalignment of a Soller-Slit Pack in a Parallel-Beam Geometry Diffractometer
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- Advances in X-ray Analysis / Volume 35 / Issue A / 1991
- Published online by Cambridge University Press:
- 06 March 2019, pp. 553-559
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- 1991
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Depth Profiling by Means of X-Ray Photoelectron Spectrometry
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- Advances in X-ray Analysis / Volume 35 / Issue B / 1991
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- 06 March 2019, pp. 857-867
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- 1991
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Application of Imaging Plate for X-Ray Diffractometry
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- Advances in X-ray Analysis / Volume 35 / Issue A / 1991
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- 06 March 2019, pp. 407-413
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- 1991
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Powder X-Ray Diffraction Characterization of Laser Deposited Ferroelectric Thin Films
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- Advances in X-ray Analysis / Volume 35 / Issue A / 1991
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- 06 March 2019, pp. 211-220
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- 1991
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Preferred Orientation Analysis in Textured Materials
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- Advances in X-ray Analysis / Volume 35 / Issue A / 1991
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- 06 March 2019, pp. 263-275
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- 1991
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Layer Thickness Determination of Thin Films by Grazing Incidence X-Ray Experiments using Interference Effect
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- Advances in X-ray Analysis / Volume 35 / Issue B / 1991
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- 06 March 2019, pp. 813-818
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- 1991
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Application of Total Reflection X-Ray Fluorescence Spectrometry to Drug Analysis
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- Advances in X-ray Analysis / Volume 35 / Issue B / 1991
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- 06 March 2019, pp. 969-974
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- 1991
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New Features and Advanced Applications of Siroquant: A Personal Computer XRD Full Profile Quantitative Analysis Software Package
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- Advances in X-ray Analysis / Volume 35 / Issue A / 1991
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- 06 March 2019, pp. 49-55
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- 1991
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Application of SR-XRF Imaging and Micro-Xanes to Meteorites, Archaeological Objects and Animal Tissues
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- Advances in X-ray Analysis / Volume 35 / Issue B / 1991
- Published online by Cambridge University Press:
- 06 March 2019, pp. 1307-1315
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- 1991
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Systematic Computation of Scattering Corrections with the Code Shape
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- Advances in X-ray Analysis / Volume 35 / Issue B / 1991
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- 06 March 2019, pp. 757-766
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- 1991
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Depth Profiling by Means of X-Ray Fluorescence Analysis
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- Advances in X-ray Analysis / Volume 35 / Issue B / 1991
- Published online by Cambridge University Press:
- 06 March 2019, pp. 783-794
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- 1991
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Prediction of the Diffraction Order Dependence of the Integral Reflection Coefficient of Multilayer Structures using Atomic Force Microscope Measurements
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- Advances in X-ray Analysis / Volume 35 / Issue A / 1991
- Published online by Cambridge University Press:
- 06 March 2019, pp. 177-183
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- 1991
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