Powder Diffraction: Volume 21 - Issue 2

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Published on behalf of International Centre for Diffraction Data

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Powder Diffraction
ISSN: 0885-7156

EISSN: 1945-7413

URL: /core/journals/powder-diffraction
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Volume 21 - Issue 2 - June 2006

Contents

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Denver X-Ray Conference

D068 New synchrotron instruments + new detectors = new science—invited
B. H. Toby
Published online by Cambridge University Press:

20 May 2016, p. 182
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F15 Arrays of large-area silicon drift detectors for advanced analytical techniques
O. Boslau, A. Pahlke, S. Pahlke, J. Kemmer, F. Wiest, T. Eggert, R. Stoetter, P. Goldstrass, M. Mikhailov
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20 May 2016, p. 182
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F17 Boron X-ray detection with a silicon multi-cathode detector
C. R. Tull, S. Barkan, V. D. Saveliev, L. Feng, M. Takahashi, N. Matsumori, D. E. Newbury, J. A. Small, J. S. Iwanczyk
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20 May 2016, p. 182
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F19 Detection of trace heavy elements in the 20–40 kev energy range using a thick silicon multi-cathode detector
L. Feng, C. R. Tull, S. Barkan, V. D. Saveliev, M. Takahashi, N. Matsumori, J. S. Iwanczyk
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20 May 2016, p. 182
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F23 Optimization of the peak-to-background ratio and the low energy response of silicon drift detectors for high resolution X-ray spectroscopy
A. Niculae, H. Soltau, P. Lechner, A. Liebl, R. Eckhard, G. Lutz, L. Strüder, G. Schaller, F. Schopper
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20 May 2016, p. 182
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F42 Parallel pulse-height X-ray spectrometer (PPSX)
F. Goldin, S. Mitchel
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20 May 2016, p. 182
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F55 Dating petroglyphs with XRF: development of the technique and initial results—invited
F. W. Lytle, N. E. Pingitore
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20 May 2016, p. 183
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F01 Micro- and local based XRF analysis in cultural heritage—invited
A. von Bohlen
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20 May 2016, p. 183
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F24 CT imaging applied to capillary water absorption in sicilian sedimentary rocks used in cultural heritages
T. Schillaci, M. Brai, D. Cascio, F. Fauci, G. Raso, A. Lo Casto, F. Sorrentino
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20 May 2016, p. 183
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C3 Probing the defect structure of natural nanoparticles with micrometer-sized synchrotron X-ray beams—invited
A. Manceau
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20 May 2016, p. 183
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F35 Application of low-power energy-dispersive X-ray fluorescence spectrometers to analysis of soils and other materials of geological origin
M. N. Ingham, L. Grimsley, B. Vrebos
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20 May 2016, p. 183
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D007 Properties and the general use of the X-ray elastic factors—invited
B. Ortner
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20 May 2016, p. 184
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D075 4-D XRD for strain in many grains using triangulation
H. A. Bale, J. C. Hanan, N. Tamura
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20 May 2016, p. 184
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D032 X-ray stress analysis employing the lattice parameter ellipsoid
R. E. Ogilvie
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20 May 2016, p. 184
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D013 Surface and bulk internal stresses in Li2O-2SiO2 glass-ceramics
H. Pinto, A. Pyzalla, L. Ito, M. Crovace, E. B. Ferreira, F. Fauth, T. Wroblewski, E. D. Zanotto
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20 May 2016, p. 184
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D062 Mechanics of microelectronic structures as revealed by X-ray diffraction—invited
C. E. Murray
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20 May 2016, p. 184
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D058 Determination of local strain field in SOI lines using high resolution X-ray diffraction
A. Loubens, M. Gailhanou, O. Thomas, J.-S. Micha, R. Fortunier, B. Charlet
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20 May 2016, p. 184
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D023 Residual stresses in thin films characterized by the combination of SIN2Ψ and curvate methods: possibilities and limitations
J. Keckes, K. J. Martinschitz, E. Eiper
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20 May 2016, p. 184
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Page 7 of 7

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Powder Diffraction

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Volume 21 - Issue 2 - June 2006

Denver X-Ray Conference

D068 New synchrotron instruments + new detectors = new science—invited

F15 Arrays of large-area silicon drift detectors for advanced analytical techniques

F17 Boron X-ray detection with a silicon multi-cathode detector

F19 Detection of trace heavy elements in the 20–40 kev energy range using a thick silicon multi-cathode detector

F23 Optimization of the peak-to-background ratio and the low energy response of silicon drift detectors for high resolution X-ray spectroscopy

F42 Parallel pulse-height X-ray spectrometer (PPSX)

F55 Dating petroglyphs with XRF: development of the technique and initial results—invited

F01 Micro- and local based XRF analysis in cultural heritage—invited

F24 CT imaging applied to capillary water absorption in sicilian sedimentary rocks used in cultural heritages

C3 Probing the defect structure of natural nanoparticles with micrometer-sized synchrotron X-ray beams—invited

F35 Application of low-power energy-dispersive X-ray fluorescence spectrometers to analysis of soils and other materials of geological origin

D007 Properties and the general use of the X-ray elastic factors—invited

D075 4-D XRD for strain in many grains using triangulation

D032 X-ray stress analysis employing the lattice parameter ellipsoid

D013 Surface and bulk internal stresses in Li2O-2SiO2 glass-ceramics

D062 Mechanics of microelectronic structures as revealed by X-ray diffraction—invited

D058 Determination of local strain field in SOI lines using high resolution X-ray diffraction

D023 Residual stresses in thin films characterized by the combination of SIN2Ψ and curvate methods: possibilities and limitations

Powder Diffraction

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Volume 21 - Issue 2 - June 2006

Denver X-Ray Conference