Article contents
Update in a Rietveld analysis program for x-ray powder spectro-diffractometry
Published online by Cambridge University Press: 05 March 2012
Abstract
A computer program for refining anomalous scattering factors using x-ray powder diffraction data was revised on the basis of the latest version of a versatile pattern-fitting system, RIETAN-2000. The effectiveness of the resulting program was confirmed by applying it to simulated and measured powder-diffraction patterns of Mn3O4 taken at a synchrotron light source.
Keywords
- Type
- Technical Articles
- Information
- Copyright
- Copyright © Cambridge University Press 2003
References
- 2
- Cited by