Hostname: page-component-8448b6f56d-dnltx Total loading time: 0 Render date: 2024-04-19T12:24:55.227Z Has data issue: false hasContentIssue false
  • English
  • Français

F-26 New Detector Architectures with Silicon Drift Detectors for XRF Applications

Published online by Cambridge University Press:  20 May 2016

A. Simsek ,
O. Jaritschin ,
A. Liebel ,
P. Lechner ,
G. Lutz ,
A. Bechteler ,
A. Niculae ,
H. Soltau ,
R. Echkardt  and
K. Hermenau
...Show all authors
A. Simsek
Affiliation:
PNDetector GmbH, Munich, Germany
O. Jaritschin
Affiliation:
PNDetector GmbH, Munich, Germany
A. Liebel
Affiliation:
PNDetector GmbH, Munich, Germany
P. Lechner
Affiliation:
PNDetector GmbH, Munich, Germany
G. Lutz
Affiliation:
PNDetector GmbH, Munich, Germany
A. Bechteler
Affiliation:
PNSensor GmbH, Munich, Germany
A. Niculae
Affiliation:
PNSensor GmbH, Munich, Germany
H. Soltau
Affiliation:
PNSensor GmbH, Munich, Germany
R. Echkardt
Affiliation:
PNSensor GmbH, Munich, Germany
K. Hermenau
Affiliation:
PNSensor GmbH, Munich, Germany
F. Schopper
Affiliation:
MPI Halbleiterlabor, Munich, Germany
L. Strüder
Affiliation:
MPI Halbleiterlabor, Munich, Germany
Get access Rights & Permissions [Opens in a new window]

Abstract

An abstract is not available for this content so a preview has been provided. Please use the Get access link above for information on how to access this content.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Denver X-Ray Conference
Information
Powder Diffraction , Volume 24 , Special Issue 2 , June 2009 , pp. 164
Copyright
Copyright © Cambridge University Press 2009

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)