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F17 Boron X-ray detection with a silicon multi-cathode detector

Published online by Cambridge University Press:  20 May 2016

C. R. Tull
Affiliation:
SII NanoTechnology, Northridge, CA
S. Barkan
Affiliation:
SII NanoTechnology, Northridge, CA
V. D. Saveliev
Affiliation:
SII NanoTechnology, Northridge, CA
L. Feng
Affiliation:
SII NanoTechnology, Northridge, CA
M. Takahashi
Affiliation:
SII NanoTechnology, Northridge, CA
N. Matsumori
Affiliation:
SII NanoTechnology, Northridge, CA
D. E. Newbury
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD
J. A. Small
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD
J. S. Iwanczyk
Affiliation:
Photon Imaging, Inc., Northridge, CA

Abstract

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Type
Denver X-Ray Conference
Copyright
Copyright © Cambridge University Press 2006

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