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X-ray Scattering from Interfaces
Published online by Cambridge University Press: 21 February 2011
Abstract
X-ray diffraction has found an increasing use in the characterization of surface structures. Due to the high penetration depth of X-rays, the technique is also very suitable for the study of buried interfaces. We will give a general outline of the technique, and then discuss two examples concerning epitaxial growth.
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- Copyright © Materials Research Society 1992