X-ray diffraction line profiles have been described in an earlier work published by the authors as a convolution of three functions: particle size broadening, and two types of non-uniform strain broadening. The strain coefficients used in this approach are simply related to the strain coefficients obtained by Krivoglaz et.al, using a theory based upon correlated dislocations. This connection enables us to determine the dislocation density and the ratio of the correlation range to the mean particle size. Results for cold worked fcc and bcc materials as well as highly imperfect sputtered films of Mo are considered. Dislocations are highly correlated in cold worked metals, whereas correlation is much lower in sputtered films deposited at low temperatures. In each case, the dislocation density is high. An analysis of wear debris consisting of cubic Zirconia gave the highest dislocation density and correlation. The close similarity between the early work on cold work filings and wear debris provides insights on wear mechanisms.