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X-RAY DIFFRACTION CHARACTERIZATION OF ELASTIC STRAIN IN COMPOSITION MODULATED LAYERED STRUCTURES

Published online by Cambridge University Press:  28 February 2011

A. F. JANKOWSKI  and
P. A. STEINMEYER
A. F. JANKOWSKI
Affiliation:
Rockwell International, North American Space Operations, Rocky Flats Plant, P.O. Box 464, Golden, CO 80402-0464
P. A. STEINMEYER
Affiliation:
Rockwell International, North American Space Operations, Rocky Flats Plant, P.O. Box 464, Golden, CO 80402-0464
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Abstract

X-ray diffraction techniques are utilized to characterize the biaxial state of stress in thermal vapor deposited, composition modulated layered structures. Thin film systems, as Au-Ni, Cu-Pd, Ag-Pd, Cu-Ni and Cu-NiFe, have manifested the ‘supermodulus effect’ as a mechanical property. The concept of interlayer coherency gives rise to the notion of accommodating misfit strains between the layers. In turn, such large elastic strains have been shown to cause large increases in the elastic moduli (the ‘supermodulus effect’) of noble metals. In the present work, pole figures are used to determine the texture and crystallographic orientations of these foils, and standard x-ray methods are then used to quantify this strain with lattice parameter measurements and diffraction peak profiles.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 56: Symposium H – Layered Structures and Epitaxy , 1985 , 447
Copyright
Copyright © Materials Research Society 1986

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