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X-ray Analysis of Ni/Ti Multilayers

Published online by Cambridge University Press:  15 February 2011

J. Chaudhuri ,
S.M. Alyan  and
A.F. Jankowski
J. Chaudhuri
Affiliation:
Mech. Eng. Dept., Wichita State University, Wichita, KS 67208.
S.M. Alyan
Affiliation:
Mech. Eng. Dept., Wichita State University, Wichita, KS 67208.
A.F. Jankowski
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA 94550.
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Abstract

The structure, composition and strain in Ni/Ti multilayers are analyzed using x-ray diffraction theories. The repeat period of the multilayers used in this study ranges from 1.3 to 12.8 nm. The composition modulation is obtained by using a kinematical theory of x-ray diffraction. A sine wave for the shorter repeat period and a rectangular wave for the longer repeat period are predicted for the composition modulation. The strain within each atomic layer is found by iteratively fitting the experimental x-ray diffraction pattern with the simulated one from a dynamical theory of x-ray diffraction. The strain at the interface is tensile in Ni and compressive in Ti with a complete relaxation of the strain at a distance away from the interface.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 308: Symposium M1 – Thin Films: Stresses and Mechanical Properties IV , 1993 , 707
Copyright
Copyright © Materials Research Society 1993

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References

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