Hostname: page-component-8448b6f56d-tj2md Total loading time: 0 Render date: 2024-04-18T21:20:11.663Z Has data issue: false hasContentIssue false

A WORM-Type Memory Device with Rectifying Effect Based on a Conjugated Copolymer of PF6Eu on Si Substrate

Published online by Cambridge University Press:  01 February 2011

Yoke Ping Tan
Affiliation:
eletyp@nus.edu.sg, National University of Singapore, Department of Electrical and Computer Engineering, 10 Kent Ridge Crescent, Singapore, Singapore, 119260, Singapore
Q.D Ling
Affiliation:
chelqd@nus.edu.sg, National University of Singapore, Department of Chemical and Biomolecular Engineering, 10 Kent Ridge Crescent, Singapore, 119260, Singapore
Y.H Teo Eric
Affiliation:
eletyhe@nus.edu.sg, National University of Singapore, Silicon Nano Device Laboratory, Department of Electrical and Computer Engineering, 10 Kent Ridge Crescent, Singapore, 119260, Singapore
Y. Song
Affiliation:
songyan@nus.edu.sg, National University of Singapore, Silicon Nano Device Laboratory, Department of Electrical and Computer Engineering, 10 Kent Ridge Crescent, Singapore, 119260, Singapore
S.L Lim
Affiliation:
g0404230@nus.edu.sg, National University of Singapore, Department of Chemical and Biomolecular Engineering, 10 Kent Ridge Crescent, Singapore, 119260, Singapore
G.Q Lo Patrick
Affiliation:
logq@ime.a-star.edu.sg, Institute of Microelectronics, 11 Science Park Road, Singapore Science Park II, Singapore, 117685, Singapore
E. T Kang
Affiliation:
cheket@nus.edu.sg, National University of Singapore, Department of Chemical and Biomolecular Engineering, 10 Kent Ridge Crescent, Singapore, 119260, Singapore
Chunxiang Zhu
Affiliation:
elezhucx@nus.edu.sg, National University of Singapore, Silicon Nano Device Laboratory, Department of Electrical and Computer Engineering, 10 Kent Ridge Crescent, Singapore, 119260, Singapore
D.S.H Chan
Affiliation:
danielchan@nus.edu.sg, National University of Singapore, Silicon Nano Device Laboratory, Department of Electrical and Computer Engineering, 10 Kent Ridge Crescent, Singapore, 119260, Singapore
Get access

Abstract

We report a non-volatile, write-once-read-many times (WORM) memory device based on a simple organic-inorganic heterojunction. The organic film used is 9, 9-dihexylfluorene and Eu-complexed benzoate (PF6Eu (DBM)), which contains both electron-donor (9, 9-dihexylfluorene) and electron-acceptor (europium complex) groups. The inorganic n-type silicon substrate is used as the bottom electrode, while the Al is used as the top electrode. Under current-voltage testing, the device is able to switch from one initial non-conducting state (OFF) to a conducting state (ON) once a threshold voltage is reached under the first positive sweep. The “OFF” state is not recoverable with subsequent negative sweep after the device is turned “ON”. The ON/OFF current ratio is around 4×104. Diode rectifying characteristics is also observed for the turned-on device with a current ratio of 7×104, which is essential to address one memory cell in large passive matrix circuits. Reliability test is carried out and the device is able to sustain its “ON” state for at least 12 hours without any external bias.

Keywords

Type
Research Article
Copyright
Copyright © Materials Research Society 2006

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Moller, S. and Forrest, S.R., J. Appl. Phys., 91, 3324 (2002)Google Scholar
2 Paloheimo, J., Kuivalainen, P., Stubb, H., Vuorimaa, E. and Yli-Lathi, P., Appl. Phys. Lett., 56, 1157 (1990)Google Scholar
3 Granstrom, M., Petritsch, K., Arias, A.C., Lux, A., Andersson, M.R. and Friend, R.H., Nature, 395, 257 (1998)Google Scholar
4 Goto, H., Yashima, E. and Am, J., Chem. Soc., 124, 7943 (2002)Google Scholar
5 Ling, Q.D., Song, Y., Ding, S. J., Zhu, Chunxiang, Chan, D.S.H., Kwong, D.L., Kang, E.T., and Neoh, K.G., Adv. Mater., 17, 455 (2005)Google Scholar
6 Smits, J.H.A., Meskers, S.C.J., Janssen, R.A.J., Marsman, A.W. and Leeuw, D.M. de, Adv. Mater., 17, 1169 (2005)Google Scholar
7 Moller, S., Perlov, C., Jackson, W., Taussig, C. and Forrest, S.R., Nature, 426, 166 (2003)Google Scholar
8 Smith, Shawn and Forrest, S.R., Appl. Phys. Lett., 84, 5019 (2004)Google Scholar
9 Song, Y., Ling, Q.D., Zhu, C., Kang, E.T., D.Chan, S.H., Wang, Y.H., and Kwong, D.L., IEEE Electron Device Lett., 27, 154 (2006)Google Scholar
10 Liu, Y., Liu, M.S. and Jen, A.K.-Y., Acta Polym., 50, 105 (1999)Google Scholar
11 Ling, Q.D., Kang, E.T., Neoh, K.G. and Huang, Wei, Macromolecules, 36, 6995 (2003)Google Scholar
12 Chen, C.K. and Raimonds, L., Electrical properties of polymer: Chemical Principles, 268, Hanser Publishers (1987)Google Scholar
13 Bredas, J.L. and Street, G.B., Acc. Chem. Res., 18, 309 (1985)Google Scholar
14 Gelinck, G.H., Excitons and polarons in luminescent conjugated polymers, 6, Delft University Press (1998)Google Scholar
15 Moller, S., Forrest, S.R., Perlov, C., Jackson, W. and Taussig, C., J. Appl. Phys., 94, 7811 (2003)Google Scholar