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Using Weibull Statistics to Analyze Ion Beam Enhanced Adhesion as Measured by the pull Test

Published online by Cambridge University Press:  22 February 2011

J. E. Pawel ,
W. E. Lever ,
D. J. Downing ,
C. J. Mchargue ,
L. J. Romana  and
J. J. Wert
J. E. Pawel
Affiliation:
Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, TN 37831–6376, USA
W. E. Lever
Affiliation:
Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, TN 37831–6376, USA
D. J. Downing
Affiliation:
Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, TN 37831–6376, USA
C. J. Mchargue
Affiliation:
The University of Tennessee, Knoxville, TN 37996–2200, USA
L. J. Romana
Affiliation:
Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, TN 37831–6376, USA
J. J. Wert
Affiliation:
Vanderbilt University, Nashville, TN 37235, USA
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Abstract

The adhesion of iron films to single crystal Al2O3 substrates was investigated using a pull test. Chromium (300 keV) or nickel (340 keV) ions were implanted to a fluence of 1 × 1015 ions-cm-2 after film deposition. The adhesion test results were widely scattered due to a random distribution of interfacial flaw sizes controlling the failure nucleation. Because Weibull statistics were developed to describe the failure probability due to a population of flaw-initiated cracks, the Weibull distribution was chosen to analyze the data. Modifications in the adhesion strength due to the ion implantation were reflected in the failure distributions. It was found that the chromium ions improved the adhesion of the Fe/Al2O3 system while the implantation of nickel did not.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 239: Symposium D – Thin Films: Stresses and Mechanical Properties III , 1991 , 541
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

1. Mittal, K.L., J. Adhesion Sci. Technol. 1, 247 (1987).Google Scholar
2. Pawel, J.E. and McHargue, C.J., J. Adhesion Sci. Technol. 2, 369 (1988).CrossRefGoogle Scholar
3. Pawel, J.E., Ion Beam Enhanced Adhesion of Metal Films to Sapphire Substrates. Ph.D. Dissertation, Vanderbilt University, Nashville, Tennessee, 1991.Google Scholar
4. Abonneau, E., Fuchs, G., Treilleux, M., and Perez, A., Nucl. Instr. Meth. Phys. Res. B 46, 111 (1990).CrossRefGoogle Scholar
5. Lin, M.R., Ritter, J.E., Rosenfeld, L., and Lardner, T.J., J. Mater. Res. 5, 1110 (1990).Google Scholar
6. Davies, D.G.S., Proc. Brit. Cer. Soc. 22, 429 (1973).Google Scholar
7. Abernethy, R.B., Breneman, J.E., Medlin, C.H., and Reinman, G.L., Weibull Analysis Handbook (Aero Propulsion Laboratory, Air Force Wright Aeronautical Laboratories, Wright Patterson Air Force Base, Ohio, 1983).Google Scholar
8. Lawless, J.F., Statistical Models and Methods for Lifetime Data (John Wiley and Sons, New York, 1982).Google Scholar
9. Pawel, J.E., McHargue, C.J., Romana, L.J., and Wert, J.J., accepted for publication in Surface and Coatings Technology.Google Scholar