Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Shimizu, M.
Fujisawa, H.
and
Niu, H.
1999.
Thickness Dependence and Electrical Properties of Ultrathin PZT Films Grown on SrRuO3/SrTiO3 by MOCVD.
MRS Proceedings,
Vol. 596,
Issue. ,
Norga, G. J.
and
Fé, Laura
2000.
Orientation Selection in Sol-Gel Derived PZT Thin Films.
MRS Proceedings,
Vol. 655,
Issue. ,
Waser, Rainer
Schneller, Theo
Hoffmann-eifert, Susanne
and
Ehrhart, Peter
2001.
Advanced chemical deposition techniques - from research to production.
Integrated Ferroelectrics,
Vol. 36,
Issue. 1-4,
p.
3.
Maki, Kazunari
Soyama, Nobuyuki
Nagamine, Kaoru
Mori, Satoru
and
Ogi, Katsumi
2001.
Preparation and evaluation of sub-100 nm Pb(Zr,Ti)O3 films derived from modified sol-gel solutions for low-voltage operation of feram.
Integrated Ferroelectrics,
Vol. 39,
Issue. 1-4,
p.
223.
Soyama, N.
Maki, K.
Mori, S.
and
Ogi, K.
2001.
Preparation of PZT thin films for low voltage application by sol-gel method.
Vol. 2,
Issue. ,
p.
611.
Stolichnov, Igor
Tagantsev, Alexander
Colla, Enrico
and
Setter, Nava
2001.
Charge relaxation at the interfaces of low-voltage ferroelectric film capacitors: Fatigue endurance and size effects.
Ferroelectrics,
Vol. 258,
Issue. 1,
p.
221.
Mört, Manfred
Nagel, Nicolas
Schindler, Günther
Mikolajick, Thomas
Hartner, Walter
Kastner, Marcus J.
Dehm, Christine
Kohlstedt, Hermann
and
Waser, Rainer
2001.
Thickness dependent morphology and electrical characteristics of SrBi2Ta2O9 deposited by metal organic decomposition.
Integrated Ferroelectrics,
Vol. 37,
Issue. 1-4,
p.
125.
Loppacher, Ch.
Schlaphof, F.
Schneider, S.
Zerweck, U.
Grafström, S.
Eng, L.M.
Roelofs, A.
and
Waser, R.
2003.
Lamellar ferroelectric domains in PbTiO3 grains imaged and manipulated by AFM.
Surface Science,
Vol. 532-535,
Issue. ,
p.
483.
Sivasubramanian, S.
Widom, A.
and
Srivastava, Y.
2003.
Equivalent circuit and simulations for the Landau-Khalatnikov model of ferroelectric hysteresis.
IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control,
Vol. 50,
Issue. 8,
p.
950.
Roelofs, A
Schneller, T
Szot, K
and
Waser, R
2003.
Towards the limit of ferroelectric nanosized grains.
Nanotechnology,
Vol. 14,
Issue. 2,
p.
250.
Schwartz, Robert W.
Schneller, Theodor
and
Waser, Rainer
2004.
Chemical solution deposition of electronic oxide films.
Comptes Rendus. Chimie,
Vol. 7,
Issue. 5,
p.
433.
Lee, S.Y.
and
Kim, K.
2004.
Prospects of emerging new memory technologies.
p.
45.
Roelofs, A.
Szot, K.
and
Waser, R.
2004.
Nanoscale Phenomena in Ferroelectric Thin Films.
p.
135.
KIM, KINAM
and
LEE, S. Y.
2004.
Future Emerging New Memory Technologies.
Integrated Ferroelectrics,
Vol. 64,
Issue. 1,
p.
3.
Clemens, S.
Schneller, T.
van der Hart, A.
Peter, F.
and
Waser, R.
2005.
Registered Deposition of Nanoscale Ferroelectric Grains by Template‐Controlled Growth.
Advanced Materials,
Vol. 17,
Issue. 11,
p.
1357.
PUCHALLA, JOCHEN
HOFFMANN-EIFERT, SUSANNE
CATTANEO, LORENA
CARELLA, SERGIO
and
WASER, RAINER
2005.
MOCVD GROWTH OF (Pb,Ba)(Zr,Ti)O3 THIN FILMS FOR MEMORY APPLICATIONS.
Integrated Ferroelectrics,
Vol. 75,
Issue. 1,
p.
225.
Schneller, Theodor
Majumder, Subhasish B.
and
Waser, Rainer
2008.
Ceramics Science and Technology.
p.
443.
Ellerkmann, U.
Schneller, T.
Nauenheim, C.
Böttger, U.
and
Waser, R.
2008.
Reduction of film thickness for chemical solution deposited PbZr0.3Ti0.7O3 thin films revealing no size effects and maintaining high remanent polarization and low coercive field.
Thin Solid Films,
Vol. 516,
Issue. 15,
p.
4713.
Calzada, M. M.
2011.
Multifunctional Polycrystalline Ferroelectric Materials.
Vol. 140,
Issue. ,
p.
93.
Robbes, D.
Jorel, C.
Olivier, E.
Mechin, L.
Lebargy, S.
Bouregba, R.
Poullain, G.
and
Cibert, C.
2013.
Electric field sensing: What is brought by duality from flux gates?.
p.
1.