Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-11-18T01:03:42.274Z Has data issue: false hasContentIssue false

Tunnel Effects in Luminescence Spectra of InGaN/AlGaN/GaN Light-Emitting Diodes

Published online by Cambridge University Press:  10 February 2011

A. E. Yunovich
Affiliation:
Moscow State Lomonosov University, Department of Physics
A. N. Kovalev
Affiliation:
Moscow Institute of Steel and Alloys, 119235, Leninsky Prospect, 4. 119899 Moscow, Russia. yunovich@sconl75.phys.msu.su
V. E. Kudryashov
Affiliation:
Moscow State Lomonosov University, Department of Physics
F. I. Manyachin
Affiliation:
Moscow Institute of Steel and Alloys, 119235, Leninsky Prospect, 4. 119899 Moscow, Russia. yunovich@sconl75.phys.msu.su
A. N. Turkin
Affiliation:
Moscow State Lomonosov University, Department of Physics
K. G. Zolina
Affiliation:
Moscow State Lomonosov University, Department of Physics
Get access

Abstract

Tunnel effects in luminescence spectra and electrical properties of blue InGaN/AlGaN/GaN LEDs were studied. The tunnel radiation in a spectral region of 2.1–2.4 eV predominates at low currents (J<0.2 mA). The role of tunnel effects grows as the maximum of the main blue line in LEDs is shifted to short wavelengths. The position of the tunnel maximum ћωmax is approximatly proportional to the voltage eU. The spectral band is described by the theory of tunnel radiative recombination. Current-voltage characteristics have a tunnel component at low direct and reverse currents. The distribution of charged impurities was received from dynamic capacitance measurements. There are charged layers at heterointerfaces and adjacent compensated layers in the structures. There is a high electric field in the active layer. The energy diagram is analysed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Zolina, K.G., Kudryashov, V.E., Turkin, A.N., Yunovich, A.E., Nakamura, S.. MRS Intern. Journ. of Nitride Semiconductor Research, 1/11; http:\\nsr.mij.mrs.org\l\l 1.Google Scholar
2. Kovalev, A.N., Kudryashov, V.E., Manyachin, F.I., Turkin, A.N., Zolina, K.G., Yunovich, A.E.. Abstr. Abstr. of 23rd Int. Symp. on Semic. Comp., ISCS-23, S.-Peterburg, Sept. 1996, Abst.03.P3.04.Google Scholar
3. Zolina, K.G., Kudryashov, V.E., Turkin, A.N., Yunovich, A.E.. FTP, 1996, to be published.Google Scholar
4. Yunovich, A.E., Ormont, A.B.. ZhETP, 1966, v. 51, N 11, pp. 12921305.Google Scholar
5. Morgan, T.N.. Phys. Rev., 1966, Vol.148, N 2, pp.890903.Google Scholar
6. Nakamura, S., Senoh, M., Iwasa, N., Nagahama, S., Yamada, T., Mukai, T.. Jpn. J. Appl. Phys. Vol.34 (Oct. 1995), Part 2, N 10b, pp.L13321335.Google Scholar
7. Zeller, J., Eliseev, P.G., Sartori, P., Perlin, P., Osinski, M.. MRS Symp. Proc. Vol.395, pp.937942.Google Scholar
8. Satta, A., Fiorentini, V., Bosin, A., Meloni, F.. MRS Symp. Proc. Vol.395, pp.515520.Google Scholar
9. Kaufmann, U., Kunser, M., Mers, C., Akasaki, I., Amano, H.. MRS Symp.Proc. Vol.395, p.633643.Google Scholar
10. Hoffinann, D.M., Kovalev, D., Steude, G., Volm, D., Meyer, B.K., Xavier, C., Monteiro, T., Pereira, E., Mokov, E.N., Amano, H., Akasaki, I.. MRS Symp. Proc. Vol.395, pp.619624.Google Scholar