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Trends in Atomic Resolution Electron Microscopy

Published online by Cambridge University Press:  21 February 2011

David J. Smith  and
M.R. Mccartney
David J. Smith
Affiliation:
also at: Department of Physics and Astronomy, Arizona State University, Tempe, AZ 85287
M.R. Mccartney
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, AZ 85287
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Abstract

Structural information on the atomic scale is readily accessible from thin samples using the technique of high-resolution electron microscopy. Electron micrographs recorded under well-defined operating conditions can be directly interpreted in terms of atomic arrangements around defects of interest such as dislocations and interfaces. Digital image recording with slow-scan CCD cameras and quantitative comparisons with image simulations based on structural models are starting to lead to improved accuracy and reliability in structure determinations. Techniques based upon holographic methods are utilizing the superior illumination coherence of the field emission electron source to enhance resolution beyond the conventional extended Scherzer limit. Innovative methods for combining image and diffraction pattern information are also leading to improved levels of resolution for periodic objects. Care is needed to ensure that electron irradiation damage and surface cleanliness do not impose unnecessary restrictions on the details that can be extracted from recorded micrographs. It is proposed that the complex wavefunction emerging from the exit-surface of the sample should be considered as a basis for comparing the differences between experimental micrographs and image simulations.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 332: Symposium U – Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy , 1994 , 43
Copyright
Copyright © Materials Research Society 1994

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