Hostname: page-component-848d4c4894-x5gtn Total loading time: 0 Render date: 2024-05-13T10:56:18.317Z Has data issue: false hasContentIssue false

Tl-Based Films: A Comparison of Processing Procedures

Published online by Cambridge University Press:  26 February 2011

B. Morosin
Affiliation:
Sandia National Laboratories, Division 1153, P. 0. Box 5800, Albuquerque, NM 87185
E. L. Venturini
Affiliation:
Sandia National Laboratories, Division 1153, P. 0. Box 5800, Albuquerque, NM 87185
C. P. Tigges
Affiliation:
Sandia National Laboratories, Division 1153, P. 0. Box 5800, Albuquerque, NM 87185
D. S. Ginley
Affiliation:
Sandia National Laboratories, Division 1153, P. 0. Box 5800, Albuquerque, NM 87185
S. R. Volk
Affiliation:
Sandia National Laboratories, Division 1153, P. 0. Box 5800, Albuquerque, NM 87185
Get access

Abstract

The structural, electrical and magnetic properties are compared for three superconducting Tl-Ca-Ba-Cu-O thin films prepared by different deposition and sintering protocols. One film containing a mixture of Tl2Ca2Ba2Cu3Ox and Tl2Ca2Ba2Cu3Oy structural phases has the best superconducting properties. Deposition of a Tl-free Ca-Ba-Cu-O precursor film followed by sintering in Tl-O vapor may be the preferred protocol to obtain a single structural phase.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Ginley, D. S., Thallium Bases High Temperature Superconductors: Chapter IX “Thin Films”, Hermann, Allen M. and Yakhmi, J. V. (North Holland, Amsterdam), in press.Google Scholar
[2] Morosin, B., Norton, M. G., Carter, C. B., Venturini, E. L., Ginley, D. S., and Tigges, C. P., J. Mater. Sci (to be submitted).Google Scholar
[3] Aselage, T., Venturini, E. L., VanDeusen, S., Headley, T. J., Eatough, M. O., and Voigt, J. A., Physica C (to be submitted).Google Scholar
[4] Lee, W. Y., Salem, J., Huang, T. C., Savoy, R., Bullock, D. C., and Parkins, S. P., Appl. Phys. Lett. 53, 329 (1988).Google Scholar
[5] Morosin, B., Ginley, D. S., Venturini, E. L., Baughman, R. J., and Tigges, S. P., Physica C. 172, 413 (1991).Google Scholar
[6] Morosin, B., Venturini, E. L., and Ginley, O. S., Physica C 183, 90 (1991).Google Scholar