Hostname: page-component-8448b6f56d-m8qmq Total loading time: 0 Render date: 2024-04-19T03:57:52.723Z Has data issue: false hasContentIssue false

Time Resolved Diagnostics of RF Plasmas: a Fluid Model for ion Concentrations in the Sheath

Published online by Cambridge University Press:  21 February 2011

Richard A. Gottscho*
Affiliation:
AT&T Bell Laboratories, 600 Mountain Ave., Murray Hill, NJ 07074
Get access

Abstract

A one-dimensional fluid model is presented for time-dependent ion concentrations in chlorine containing discharges. The ion formation rate is determined from experimental plasma-induced emission intensities. The local field is estimated from spectrally resolved laser-induced fluorescence data obtained in similar, BCl3 discharges. Quantitative agreement with experiment is obtained implying that the basic assumptions in the model are valid: (1) ground state ions in the sheath are formed predominantly by electron-impact ionization; (2) Cl2+ ion motion is mobilitylimited by charge exchange collisions with Cl2 neutrals; (3) the degree of Cl2 dissociation is ∼. 65% at a power density of 1.8 W cm−3; (4) the ion concentration near the electrode is spatially uniform throughout most of the rf cycle; and (5) there are two times during a low frequency rf cycle when ions experience a strong extraction force.

Semi-empirical models like the one described here should be useful in computational optimization of plasma processes such as etching and deposition, which are in wicre-spread use throughout the microelectronics industry.

Type
Research Article
Copyright
Copyright © Materials Research Society 1985

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Chapman, B., Glow Discharge Processes, John Wiley and Sons (New York, 1980).Google Scholar
[2] Bruce, R. H., J. Appl. Phys. 52, 7064 (1981).Google Scholar
[3] Gottscho, R. A. and Mandich, M. L., J. Vac. Sci. Technol., submitted.Google Scholar
[4] Gottscho, R. A., Burton, R. H., Flamm, D. L., Donnelly, V. M., and Davis, G. P., J. Appl. Phys. 55, 2707 (1984).CrossRefGoogle Scholar
[5] Barker, R. A., Mayer, T. M., and Pearson, W. C., J. Vac. Sci. Technol. B 1, 37 (1983).CrossRefGoogle Scholar
[6] Dillon, J. A. Jr., Sheridan, W. F., and Edwards, H. D., J. Chem. Phys. 23, 776 (1955).Google Scholar
[7] McDaniel, E. W. and Mason, E. A., The Mobility and Diffusion of Ions in Gases, John Wiley & Sons (New York, 1973).Google Scholar
[8] Donnelly, V. M., Flamm, D. L., and Collins, G., J. Vac. Sci. Technol. 21, 817 (1982).Google Scholar
[9] Moore, C. A., Davis, G. P., and Gottscho, R. A., Phys. Rev. Lett. 52, 538 (1984).Google Scholar
[10] Mandich, M. L. and Gottscho, R. A., J. Chem. Phys. (submitted).Google Scholar
[11] Gottscho, R. A., unpublished results.Google Scholar
[12] Brown, S. C., Basic Data of Plasma Physics, MIT Press and John Wiley & Sons, Inc. (New York, 1959).Google Scholar
[13] Rosny, G., Mosburg, E. R. Jr., Abelson, J. R., Devaud, G., and Kerns, R. C., J. Appl. Phys. 54, 2272 (1983).Google Scholar
[14] Flamm, D. L. and Donnelly, V. M., unpublished results.Google Scholar
[15] Flamm, D. L., Gilliland, E. R., and Baddour, R. F., Ind. Eng. Chem. Fundam. 12, 277 (1973).CrossRefGoogle Scholar
[16] Kushner, M. J., J. Appl. Phys. 54, 4958 (1983).Google Scholar
[17] Kushner, M. J., Anderson, H. M., Hargis, P. J., Materials Research Society, these proceedings (1985).Google Scholar
[18] Bracewell, R. N., The Fourier Transform and its Applications, McGraw-Hill (New York, 1978).Google Scholar
[19] Rosenstock, H. M., Draxl, K., Steiner, B. W., and Herron, J. T., J. Phys. Chem. Ref. Data 6, Supp. 1 (1977).Google Scholar
[20] Davis, G. P. and Gottscho, R. A., J. Appl. Phys. 54, 3080 (1983).Google Scholar
[21] Huberman, F. P., J. Mol. Spectrosc. 20, 29 (1966).Google Scholar