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Thickness Measurements and Optical Characterization of Thin Polymer Films

Published online by Cambridge University Press:  15 February 2011

J. F. Wall ,
J. C. Brumfield ,
R. W. Murray  and
E. A. Irene
J. F. Wall
Affiliation:
Department of Chemistry, University of North Carolina Chapel Hill, North Carolina 27599-3290
J. C. Brumfield
Affiliation:
Department of Chemistry, University of North Carolina Chapel Hill, North Carolina 27599-3290
R. W. Murray
Affiliation:
Department of Chemistry, University of North Carolina Chapel Hill, North Carolina 27599-3290
E. A. Irene
Affiliation:
Department of Chemistry, University of North Carolina Chapel Hill, North Carolina 27599-3290
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Abstract

Polyphenylene oxide (PPO) films have been investigated as protective coatings and as selective inhibitors to permeants.1,2,3 These films have been shown to be passivating materials and therefore are potentially interesting for a variety of applications. It is important for further applications to be able to measure the thickness of thin films by nondestructive techniques, which is the subject of this report. In this study PPO films of various thicknesses were electrodeposited on highly oriented pyrolytic graphite (HOPG) electrodes and examined by spectroscopic ellipsometry (SE) and atomic force microscopy (AFM). These techniques are combined to yield the thickness of the polymer film and the optical properties of the HOPG substrate and the PPO overlayer in the visible and near ultraviolet spectral region.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 304: Symposium H – Polymer/Inorganic Interfaces , 1993 , 221
Copyright
Copyright © Materials Research Society 1993

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