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Texturing and Dielectric Properties of Laser Deposited BaTiO3 Thin Films Grown on Heated Substrates

Published online by Cambridge University Press:  25 February 2011

M.D. Vaudin
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899
L.P. Cook
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899
W. Wong-Ng
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899
P.K. Schenck
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899
P.S. Brody
Affiliation:
Harry Diamond Laboratories, Adelphi, MD 20783
B.J. Rod
Affiliation:
Harry Diamond Laboratories, Adelphi, MD 20783
K.W. Bennett
Affiliation:
Harry Diamond Laboratories, Adelphi, MD 20783
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Abstract

Thin films of BaTiO3 were deposited on platinum-coated silicon substrates using pulsed laser deposition and characterized using electron microscopy, powder x-ray diffraction and electrical measurements. The microstructure consisted of columnar BaTiO3 grains oriented normal to the substrate. Two preferred orientations were observed, with either the (001) or (111) planes of BaTiO3 being parallel to the substrate. The electrical properties of two films were measured and it was found that the (111) film was ferroelectric and the (001) film was not. Possible reasons for this are discussed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

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References

1. Schenck, P.K., Cook, L.P., Zhao, J., Hastie, J.W., Farabaugh, E.N., Chiang, C.K., Vaudin, M.D. and Brody, P.S. in Beam Solid Interaction: Physical Phenomena, edited by Knapp, J.A., Borgesen, P. and Zuhr, R.A. (Mater. Res. Soc. Proc. 157A, Pittsburgh, PA 1990) pp. 587592.Google Scholar
2. Brody, P.S., Benedetto, J.M., Rod, B.S., Bennett, K.W., Cook, L.P., Schenck, P.K., Chiang, C.K. and W. Wong-Ng, Proc, Seventh International Symposium on Application of Ferroelectrics (1990), Univ. Illinois, Urbana-Champaign.Google Scholar
3. Cook, L.P., Vaudin, M.D., Schenck, P.K., Wong-Ng, W., Chiang, C.K. and Brody, P.S., in Evolution of Thin-Film and Surface Microstructure, edited by Thompson, C.V., Tsao, J.Y. and Srolovitz, D.J. (Mater. Res. Soc. Proc. 202, Pittsburgh, PA 1990) pp. 241246.Google Scholar
4. Chiang, C.K., Wong-Ng, W., Schenck, P.K., Cook, L.P., Vaudin, M.D., P.S Brody, Rod, B.J. and Benedetto, J.M. in Phase Transformation Kinetics in Thin Films, edited by Chen, M., Thompson, M., Schwartz, R. and Libera, M. (Mater. Res. Soc. Proc. 230, Pittsburgh, PA 1991).Google Scholar
5. Wong-Ng, W., Cook, L.P., Schenck, P.K., Vaudin, M.D., Chiang, C.K., Robins, L.H., Huang, T.C., and Brody, P.S., Advances in X-ray Analysis (1992), accepted for publication.Google Scholar
6. Touloukian, Y.S., Kirby, R.K., Taylor, R.E. and Desai, P.D., Thermophysical Properties of Matter 12, IFI/Plenum, New York, 1970.Google Scholar
7. Kay, H.F. and Vousdan, P., Philos. Mag. 7 (40), 1019 (1949).Google Scholar