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Surface Analysis of YBa2 Cu30 Thin Films with Rheed-Traxs

Published online by Cambridge University Press:  15 February 2011

S. Ogota ,
N. Futaki ,
Z. Liu ,
Y. Kanke  and
T. Morishita
S. Ogota
Affiliation:
Superconductivity Research Laboratory, ISTEC 10–13 Shinonome 1-chome, Koto-ku, Tokyo 135 JAPAN
N. Futaki
Affiliation:
Superconductivity Research Laboratory, ISTEC 10–13 Shinonome 1-chome, Koto-ku, Tokyo 135 JAPAN
Z. Liu
Affiliation:
Superconductivity Research Laboratory, ISTEC 10–13 Shinonome 1-chome, Koto-ku, Tokyo 135 JAPAN
Y. Kanke
Affiliation:
Superconductivity Research Laboratory, ISTEC 10–13 Shinonome 1-chome, Koto-ku, Tokyo 135 JAPAN
T. Morishita
Affiliation:
Superconductivity Research Laboratory, ISTEC 10–13 Shinonome 1-chome, Koto-ku, Tokyo 135 JAPAN
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Abstract

Total Reflection Angle X-Ray Spectroscopy with Reflection High Energy Electron Diffraction (RHEED-TRAXS) is a highly sensitive method for surface analysis. Yba2Cu3O7-x films of less than 1 unit cell average coverage can be detected by its characteristic x-rays. We grew YBCO films on MgO substrates by laser-ablation with two different kinds of surface morphology; one had few particles on a flat surface and the other had many long and narrow islands on the surface which we call linear islands. We measured the take-off angle dependence of TRAXS on these films. For the YBCO films with linear islands the intensities of YLα, BaLα and CuKα x-ray lines have shoulders at the critical angles given by a theoretical formula. For the YBCO films with smooth surfaces, only the BαLa intensity had a sharp peak at the critical angle. The result suggests that a BaO layer terminates YBCO films, or that a chemical reaction occurs at the surface and Ba compounds is produced.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 401: Symposium G – Epitaxial Oxide Thin Films II , 1995 , 399
Copyright
Copyright © Materials Research Society 1996

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