Hostname: page-component-848d4c4894-jbqgn Total loading time: 0 Render date: 2024-07-06T12:02:53.866Z Has data issue: false hasContentIssue false
  • English
  • Français

Surface Analysis of YBa2 Cu30 Thin Films with Rheed-Traxs

Published online by Cambridge University Press:  15 February 2011

S. Ogota ,
N. Futaki ,
Z. Liu ,
Y. Kanke  and
T. Morishita
S. Ogota
Affiliation:
Superconductivity Research Laboratory, ISTEC 10–13 Shinonome 1-chome, Koto-ku, Tokyo 135 JAPAN
N. Futaki
Affiliation:
Superconductivity Research Laboratory, ISTEC 10–13 Shinonome 1-chome, Koto-ku, Tokyo 135 JAPAN
Z. Liu
Affiliation:
Superconductivity Research Laboratory, ISTEC 10–13 Shinonome 1-chome, Koto-ku, Tokyo 135 JAPAN
Y. Kanke
Affiliation:
Superconductivity Research Laboratory, ISTEC 10–13 Shinonome 1-chome, Koto-ku, Tokyo 135 JAPAN
T. Morishita
Affiliation:
Superconductivity Research Laboratory, ISTEC 10–13 Shinonome 1-chome, Koto-ku, Tokyo 135 JAPAN
Get access

Abstract

Total Reflection Angle X-Ray Spectroscopy with Reflection High Energy Electron Diffraction (RHEED-TRAXS) is a highly sensitive method for surface analysis. Yba2Cu3O7-x films of less than 1 unit cell average coverage can be detected by its characteristic x-rays. We grew YBCO films on MgO substrates by laser-ablation with two different kinds of surface morphology; one had few particles on a flat surface and the other had many long and narrow islands on the surface which we call linear islands. We measured the take-off angle dependence of TRAXS on these films. For the YBCO films with linear islands the intensities of YLα, BaLα and CuKα x-ray lines have shoulders at the critical angles given by a theoretical formula. For the YBCO films with smooth surfaces, only the BαLa intensity had a sharp peak at the critical angle. The result suggests that a BaO layer terminates YBCO films, or that a chemical reaction occurs at the surface and Ba compounds is produced.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 401: Symposium G – Epitaxial Oxide Thin Films II , 1995 , 399
Copyright
Copyright © Materials Research Society 1996

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Chang, C. C., Hegde, M. S., Wu, X. D., Dutta, B., Inam, A., Venkatesan, T., Wilkens, B. J., and Wachtman, J. B., J. Appl. Phys. 67, 7483 (1990).Google Scholar
2. Frank, G., Ziegler, C., and GöSpel, W., Phys. Rev. B 43, 2828 (1991).Google Scholar
3. Tanaka, S., Nakamura, T., Tokuda, H., and Iiyama, M., Appl. Phys. Lett. 62, 3040 (1993).Google Scholar
4. Ramsey, M. G., Netzer, F. P., and Matthew, J. A. D., Phys. Rev. B 39, 732 (1989).Google Scholar
5. Ogawa, K., Fujiwara, J., Takei, H., and Asaoka, H., Phisica C 190, 39 (1991).Google Scholar
6. Parmigiani, F., Samoggia, G., Calandra, C., and Manghi, F., J. Appl. Phys. 66, 5958 (1989).Google Scholar
7. Shimura, K., Daitoh, Y., Yano, Y., Terashima, T., Bando, Y., Matsuda, Y., and Komiyama, S., Physica C 228, 91 (1994).Google Scholar
8. Hasegawa, S., Ino, S., Yamamoto, Y., and Daimon, H., Jpn. J. Appl. Phys. 24, L387 (1985).Google Scholar
9. Ino, S., Ichikawa, T., and Okada, S., Jpn. J. Appl. Phys. 19, 1451 (1980).Google Scholar
10. Usui, T., Kamei, M., Aoki, Y., Morishita, T., and Tanaka, S., Physica C 191, 321 (1992).Google Scholar
11. Kamei, M., Aoki, Y., Ogota, S., Usui, T., and Morishita, T., J. Appl. Phys. 74, 436 (1993).Google Scholar
12. Hazen, R. M., Finger, L. W., Angel, R. J., Prewitt, C. T., Ross, N. L., Mao, H. K., Hadidiacos, C. G., Hor, P. H., Meng, R. L. and Chu, C. W., Phys. Rev. B 35, 723 (1987).Google Scholar