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Stressed In Situ X-Ray Diffraction Studies of a Ni-Ti Shape Memory Alloy

Published online by Cambridge University Press:  15 February 2011

J. Y. Hwang  and
C. F. Yang
J. Y. Hwang
Affiliation:
Materials Research Laboratories, Industrial Technology Research Institute, Hsinchu, Taiwan, Republic of China.
C. F. Yang
Affiliation:
Materials Engineering Department, Tatung Institute of Technology, Taipei, Taiwan, Republic of China.
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Abstract

The B2 ⌊ R ⌊ B19′ phase transformations in a Ni-50.7 at.% Ti alloy were investigated under a series of uniaxial tensile stresses. A custom-build X-ray sample holder with hot, cold and stressing stages was used for structure analysis at temperatures up to 140 °C under a variety of tensile stresses (up to 250 MPa). Reorientation and growth of favorably oriented variant domains of R phase and martensite under stress were observed. In the stress-assisted phase transformations, the favorable (020)M and (300)R planes are expected to align preferably parallel to (011)B2 planes, and the unfavorable (111)M and (112)R planes perpendicular to the (011)B2 planes. In addition, the results of semi-quantitative analyses of the relative amounts of parent phase and martensite formed under a specific stress and temperature condition, x=x(σ,T), are presented.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 276: Symposia U/Y – Smart Materials Fabrication and Materials for Micro-Electro-Mechanical Systems , 1992 , 183
Copyright
Copyright © Materials Research Society 1992

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References

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