Hostname: page-component-8448b6f56d-sxzjt Total loading time: 0 Render date: 2024-04-23T21:49:29.986Z Has data issue: false hasContentIssue false

Strain-Induced Reconstruction of Impurity States in PbTe(Ga) Films

Published online by Cambridge University Press:  15 February 2011

Boris A. Akimov
Affiliation:
Moscow State University, Physics Department, Moscow 119899, Russia
Ludmila I. Ryabova
Affiliation:
Moscow State University, Physics Department, Moscow 119899, Russia
Evgeniy I. Slynko
Affiliation:
Moscow State University, Physics Department, Moscow 119899, Russia
Get access

Abstract

n-type PbTe(Ga) films were grown by the laser deposition and the hot wall techniques on BaF2 substrates in <111> orientation. Doping results in the appearance of a high-ohmic state with nearly intrinsic free carrier concentration at low temperatures and activation character of conductivity at T∼300 K. Persistent photoconductivity has been observed at T < 100 K. In the hot wall-grown layers a new effect of bistability during the cooling-heating-cooling cycles has been found. On the first stage of the cycle a rapid decrease of resistivity (∼3 orders of magnitude) is observed at To∼50 K. The value of To changes by ± 15 K depending on the cooling rate. After a brief heating up to 80 K the subsequent cooling results in the high-ohmic state of the layer at the low temperatures. This state seems to be unstable. Relaxation to the low ohmic state can be accelerated by the application of electric field. The effect may be understood in terms of bistability of the Ga impurity charge state under the action of strain between the film and the substrate during the cooling-down process.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Kaidanov, V.I., Ravich, Yu.I., Uspekhi Fiz. Sov.Phys.Usp. 28, 31 (1985).CrossRefGoogle Scholar
2 Bushmarina, G.S., Gruzinov, B.F., Drabkin, I.A., Lev, E.Ya., Moizhes, B.Ya., Suprun, S.G., Inorg.Mater. 23, 195 (1987).Google Scholar
3 Akimov, B.A., Brandt, N.B., Gaskov, A.M., Zlomanov, V.P., Ryabova, L.I., Khokhlov, D.R., Sov.Phys.Semicond. 17, 53 (1983).Google Scholar
4 Novoselova, A.V., Zlomanov, V.P., Gaskov, A.M., Ryabova, L.I., Lazarenko, M.A., Lisina, N.G., Vestnik MGU, ser."Khimiya" 23, 3 (1982).Google Scholar
5 Belokon', S.A., Vereshagina, L.N., Ivanchik, I.I., Ryabova, L.I., Khokhlov, D.R., Fiz. Tekh.Poluprov. 26, 264 (1992).Google Scholar
6 Mollmann, K.-P., Herrmann, K.H., and Enderlein, R., Proc.l6th Intemat. conf. Phys.Semicond. Montpellier 1982, in: Physica 117/118B, 582 (1983).Google Scholar
7 Herrmann, K.H., Mollmann, K.-P., Wendt, M., Phys.Stat.Sol. (a) 80, 541 (1983).CrossRefGoogle Scholar
8 Lebedev, A.I., Aitikeeva, T.D., Sov.Phys.Semicond. 18, 1227 (1984).Google Scholar
9 Troyan, Yu.G., Sizov, F.F., Lakeenkov, V.M., Sov.Phys.Semicond. 20, 1113 (1986).Google Scholar
10 Akimov, B.A., Brandt, N.B., Ryabova, L.I., Khokhlov, D.R., Chudinov, S.M., Yatsenko, O.B., Zh.eksper.teor.Fiz.Pisma 31, 304 (1980).Google Scholar