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Solution Synthesis and Photoluminescence Studies of Small Crystallites of Cadmium Telluride

Published online by Cambridge University Press:  15 February 2011

Robert F. Jarvis Jr.
Affiliation:
Department of Chemistry and Biochemistry and the Solid State Science Center, University of California, Los Angeles 90024
Matthias Müllenborn
Affiliation:
Department of Materials Science and Engineering, University of California, Los Angeles 90024
Ben G. Yacobi
Affiliation:
Department of Materials Science and Engineering, University of California, Los Angeles 90024
Nancy M. Haegel
Affiliation:
Department of Materials Science and Engineering, University of California, Los Angeles 90024
Richard B. Kaner
Affiliation:
Department of Chemistry and Biochemistry and the Solid State Science Center, University of California, Los Angeles 90024
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Abstract

Small crystallites of CdTe have been produced using a new solution synthetic method. In this technique, Cdl2 and Na2Te are each dissolved separately in methanol before rapid mixing. The product of this reaction is pure, stoichiometric CdTe with interesting electronic and optical properties. Photoluminescence studies of this material show a blue shift due to the quantum confinement, indicating the presence of small crystallites. Transmission electron microscopy confirms the presence of nanocrystals. Reaction temperature and processing conditions can be varied to change the crystallite sizes produced. This synthesis can also produce nanocrystalline HgTe.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

1. (a) Rossetti, R., Nakahara, S., Brus, L. E., J. Chem. Phys. 79 1086 (1983). (b) L. Brus, J. Phys. Chem. 90. 2555 (1986).CrossRefGoogle Scholar
2. Wang, Y., Suna, A., Mahler, W., Mater. Res. Soc. Proc. 109, 187 (1988).Google Scholar
3. (a) Herron, N., Wang, Y., Eddy, M. M., Stucky, G. D., Cox, D. E., Moller, K., Bein, T., J. Am. Chem. Soc. 111, 530 (1989). (b) Y. Wang, N. Herron, J. Phys. Chem. 91, 257 (1987).Google Scholar
4. Cao, G., Rabenberg, L. K., Nunn, C. M., Mallouk, T. E., Chem. Mater. 3 149 (1991).Google Scholar
5. Lianos, P., Thomas, J. K., Chem. Phys. Lett. 125, 299 (1986).Google Scholar
6. Fojtik, A., Weller, H., Koch, U., Henglein, A., Ber. Bunsenges. Phys. Chem. 88, 969 (1984).Google Scholar
7. Steigerwald, M. L., A.ivissatos, A. P., Gibson, J. M., Harris, T. D., Kortan, R., Muller, A. J., Thayer, A. M., Duncan, T. M., Douglass, D. C., Brus, L. E., J. Am. Chem. Soc. 110 3046 (1988).Google Scholar
8. Schmitt-Rink, S., Miller, D. A. B., Chemla, D. S., Phys. Rev. B 35, 8113 (1987).CrossRefGoogle Scholar
9. (a) Youn, H. C., Tricot, Y. M., Fendler, J. H., J. Phys. Chem. 91, 581 (1987). (b) M. Meyer, C. Wallberg, K. Kurihara, J. H. fendler, J. Chem. Soc., Chem. Commun. 1984, 90 and reference 1 therein.Google Scholar
10. Brennan, J. G., Siegrist, T., Carroll, P. J., Stuczynski, S. M., Reynders, P., Brus, L. E., Steigerwald, M. L., Chem. Mater. 2 403 (1990).CrossRefGoogle Scholar
11. Stuczynski, S. M., Brennan, J. G., Steigerwald, M. L., Inorg. Chem. 28, 4431 (1987).Google Scholar
12. Liu, L. C., Kim, M. J., Risbud, S. J., Carpenter, R. W., Philos. Mag. B 63, 769 (1991).CrossRefGoogle Scholar
13. Jarvis, R. F. Jr.,, Kaner, R. B., Müllenborn, M., Yacobi, B. G., Haegel, N. M., Coleman, C. C., J. Am. Chem. Soc. (submitted).Google Scholar
14. Müllenborn, M., Yacobi, B. G., Haegel, N. M., Jarvis, R. F. Jr.,, Kaner, R. B., Appl. Phys. Lett. (submitted).Google Scholar
15. Cullity, B. D., Elements of X-ray Diffraction, 2nd Ed. (Addison-Wesley Pub. Co., Massachusetts, 1978).Google Scholar
16. Powder Diffraction File; Joint Committee on Powder Diffraction Standards-International Center for Diffraction Data, Swarthmore, PA, 1986, File No. 15–770 (CdTe) and File No. 32–665 (HgTe).Google Scholar
17. Eychmüller, A., Katsikas, L., Weller, H., Langmuir 6, 1605 (1990).Google Scholar
18. Cingolani, R., Moro, C., Manno, D., Striccoli, M., DeBlasi, C., Righini, G. C., Ferrara, M., J. Appl. Phys. 70, 6898 (1991).Google Scholar