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Single State Absorption Spectra of Novel Nonlinear Optical Materials

Published online by Cambridge University Press:  10 February 2011

Sean M. Kirkpatrick
Affiliation:
Science Applications International Corporation, 4031 Colonel Glenn Highway, Dayton, Ohio 45431, sean.kirkpatrick @afrl.af.mil Air Force Research Laboratory, Materials and Manufacturing Directorate, Wright-Patterson Air Force Base, Ohio
Casey Clark
Affiliation:
Department of Electro-Optics, University of Dayton, Dayton, Ohio 45420 Air Force Research Laboratory, Materials and Manufacturing Directorate, Wright-Patterson Air Force Base, Ohio
Richard L. Sutherland
Affiliation:
Science Applications International Corporation, 4031 Colonel Glenn Highway, Dayton, Ohio 45431, sean.kirkpatrick @afrl.af.mil Air Force Research Laboratory, Materials and Manufacturing Directorate, Wright-Patterson Air Force Base, Ohio
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Abstract

During the absorption of a laser pulse of moderate length, the leading edge can experience excited state absorption out of the first singlet state. The measurement of this excited state absorption spectrum can only be accurately probed using short pulse pump-probe techniques. Specifically, we examine the excited state absorption of AF-380 in THF using ultrafast transient white light absorption spectroscopy (TWLA). This material has been the focus of several investigations due to it's purported large two-photon absorption cross-section, the discrepancies between long and short pulse measurements, and it's use in holographic twophoton induced photopolymerization. It is believed that a substantial excited state absorbance can account for the difference in two-photon cross section measurements. It is also possible that this excited state exhibits coherence for time scales that can affect further absorption of longer pump pulses. We examine the transient absorption of this species, as well as polarization and free carrier effects and discuss the possible implications with regards to measurement techniques.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

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