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Silicon Carbide Radiation Detectors: Progress, Limitations and Future Directions

Published online by Cambridge University Press:  12 November 2013

Frank H. Ruddy
Frank H. Ruddy*
Affiliation:
Ruddy Consulting, 2162 Country Manor Drive, Mt. Pleasant, SC 29466, U.S.A.
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Abstract

Silicon carbide has long been a promising material for semiconductor applications in high-temperature environments. Although silicon carbide radiation detectors were demonstrated more than a half century ago, the unavailability of high-quality materials and device manufacturing techniques hindered further development until about twenty years ago. In the late twentieth century, the development of advanced SiC crystal growth and epitaxial chemical vapor deposition methods spurred rapid development of silicon carbide charged particle, X-ray and neutron detectors. The history and status of silicon carbide radiation detectors as well as the influence of materials and device packaging limitations on future detector development will be discussed. Specific silicon carbide materials development needs will be identified.

Keywords

semiconductingsensornuclear materials
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1576: Symposium WW – Nuclear Radiation Detection Materials , 2013 , mrss13-1576-ww01-01
Copyright
Copyright © Materials Research Society 2013 

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References

REFERENCES

Babcock, R. V., Ruby, S. L., Schupp, F. D., and Sun, K. H., Westinghouse Electric Corporation Materials Engineering Report No. 5711-6600-A, November, 1957 (unpublished).Google Scholar
Babcock, R. V. and Chang, H. C., “Silicon Carbide Neutron Detectors for High-Temperature Operation” Proceedings of the Symposium on Neutron Detection, Dosimetry, and Standardization, Vienna, December 1962, Volume 1 pp 613–622.Google Scholar
Babcock, R., “Radiation Damage in SiC”, Westinghouse Research and Development Center Document No. 64–8C2-432-P1, October, 1964 (unpublished) Google Scholar
Ferber, R. R. and Hamilton, G. N., “Silicon Carbide High Temperature Neutron Detectors for Reactor Instrumentation”, Westinghouse Research and Development Center Report No. 65–1C2-RDFCT-P3, June, 1965 (unpublished).CrossRefGoogle Scholar
Tikhomirova, V. A., Fedoseeva, O. P. and Kholuyanov, G. F., Soviet Physics – Semiconductors 6, No. 5, (1972).Google Scholar
Tikhomirova, V. A., Fedoseeva, O. P. and Kholuyanov, G. F., Atomnaya Energiya 34, (1973).Google Scholar
Tikhomirova, V. A., Fedoseeva, O. P. and Bol’shakov, V. V., Izmeritel naya Tekhnika 6, 67 (1973).Google Scholar
Ruddy, F. H., Dulloo, A. R., Seidel, J. G., Seshadri, S. and Rowland, L. B., IEEE Transactions on Nuclear Science 45, 536 (1998).CrossRefGoogle Scholar
Nava, F., Vanni, P., Lanzieri, C. and Canali, C., Nucl. Instrum. Meth. A437, 354 (1999).CrossRefGoogle Scholar
Dulloo, A. R., Ruddy, F. H., Seidel, J. G.. Davison, C., Flinchbaugh, T. and Daubenspeck, T., IEEE Transactions on Nuclear Science 46, 275 (1999).CrossRefGoogle Scholar
Bertuccio, G., Casiraghi, R. and Nava, F., IEEE Transactions on Nuclear Science 48, 232 (2001).CrossRefGoogle Scholar
Chen, H.-C. I., Dulloo, A. R., Seidel, J. G. and Ruddy, F. H., “Detection of Minimum Ionizing Beta-Particle Radiation with a Silicon Carbide Radiation Detector, Westinghouse Science & Technology Center Report No. 98–1TK1-SICBX-R1 October, 1998 (unpublished).Google Scholar
Dulloo, A. R., Seidel, J. G., Adams, J. M., Nico, J. S. and Gilliam, D. M., Nucl. Instrum. Meth. A422, 47 (1999); A498, 415(2003).Google Scholar
Ruddy, F. H., Dulloo, A. R., Petrović, B. and Seidel, J. G., “Fast Neutron Spectrometry Using Silicon Carbide Detectors”, Reactor Dosimetry in the 21st Century, Wagemans, J., Abderrahim, H. A., D’hondt, P., and De Raedt, C. (Eds.), World Scientific, London (2003) pp 347–355.CrossRefGoogle Scholar
Nava, F., Bertuccio, G., Cavallini, A. and Vittone, E., Measurement Science and Technology 19, 1 (2008).CrossRefGoogle Scholar
Bertuccio, G., Caccia, S., Puglisi, D. and Macera, D., Nucl. Instrum. Meth. A652, 193 (2011).CrossRefGoogle Scholar
Franceschini, F. and Ruddy, F. H., “Silicon Carbide Neutron Detectors”, Properties and Applications of Silicon Carbide (Gerhardt, R., Ed.) Intech Europe, p 275 (2011).Google Scholar
Available from Cree, Inc. 3026 E Cornwallis Road, Research Triangle Park, North Carolina 27709, USA http://www.cree.com/news-and-events/cree-news/press-releases/2012/august/150mm-wafers Google Scholar
Ruddy, F. H., Dulloo, A. R., Seidel, J. G., Palmour, J. W. and Singh, R., Nucl. Instrum. Meth. A505, 159 (2003).CrossRefGoogle Scholar
Ruddy, F. H., Seidel, J. G., Chen, H., Dulloo, A. R. and Ryu, S.-H., IEEE Transactions on Nuclear Science 53, 1713 (2006).CrossRefGoogle Scholar
Ivanov, E. Kalinina, G. Kholuyanov, N. Strokan, G. Onushkin, A. Konstantinov, A. Hallén, A. Kuznetsov, A., Materials Science Forum 483-485, 1029 (2005).Google Scholar
Pullia, A., Bertuccio, G., Maiocchi, D., Caccia, S. and Zocca, F., IEEE Transactions on Nuclear Science 55, 3736 (2008).CrossRefGoogle Scholar
Ruddy, F. H., Seidel, J. G. and Sellin, P., IEEE 2009 Nuclear Science Symposium Conference Record (NSS/MIC) 2201 (2010).Google Scholar
Chaudhuri, S. K., Zavalla, K. J. and Mandal, K. C., Nucl. Instrum. Meth. A728, 97 (2013).CrossRefGoogle Scholar
Strokan, N. B., Ivanov, A. M., Lebedev, A. A., Syväjärvi, M. and Yakimova, R., Semiconductors 39, 1469 (2005).Google Scholar
Yakimova, R., Lebedev, A. A., Ivanov, A. M., Strokan, N. B. and Syväjärvi, M., Materials Science Forum 527-529, 1477 (2006).Google Scholar
Knoll, G. F., Radiation Detection and Measurement, Fifth Edition, Wiley, p403 (2010).Google Scholar
Steinbauer, E., Bauer, P., Geretschläger, M., Bortels, G., Biersack, J. P. and Burger, P., Nucl. Instrum. Meth. B85, 642 (1994).CrossRefGoogle Scholar
Alkazov, G. D., Komar, A. P. and Vorob’ev, A. A., Nucl. Instrum. Meth. 48, 1 (1967).CrossRefGoogle Scholar
Knoll, G. F., Radiation Detection and Measurement, Fifth Edition, Wiley, p368 (2010).Google Scholar
Ciolini, R., Di Fulvio, A., Piotto, M., Diligenti, A. and d’Errico, F., Radiation Measurements 46, 1634 (2011).CrossRefGoogle Scholar
Knoll, G. F., Radiation Detection and Measurement, Fifth Edition, Wiley, p385 (2010).Google Scholar
Bertuccio, G., “HiTSiC: High Thickness Epitaxial Silicon Carbide Detectors”, presentation given in Rome, September 25, 2006 (unpublished).Google Scholar
Kimoto, T. and Sudu, J., “Epitaxial Growth and Defect Control for High-Voltage Power Devices”, Journal of the Vacuum Society of Japan 54, 362 (2011).CrossRefGoogle Scholar
Ruddy, F. H., Seidel, J. G. and Franceschini, F., “Measurements of the Recoil-Ion Response of Silicon Carbide Detectors to Fast Neutrons”, Reactor Dosimetry State of the Art 2008, Voorbraak, W., et al. . (Eds.), World Scientific, 120 (2009).Google Scholar
Flammang, R. W., Seidel, J. G. and Ruddy, F. H., Nucl. Instrum. Meth. A579, 177 (2007).CrossRefGoogle Scholar
Ruddy, F. H., Seidel, J. G. and Flammang, R. W., IEEE Nuclear Science Symposium Conference Record 82, (2006).Google Scholar
Blackburn, B. W., Johnson, J. T., Watson, S. M., Chichester, D. L., Jones, J. L., Ruddy, F. H., Seidel, J. G. and Flammang, R. W., “Fast Digitization and Discrimination of Prompt Neutron and Photon Signals Using a Novel Silicon Carbide Detector”, Optics and Photonics in Global Homeland Security, Saaito, T., et al. . (Eds.), Proceedings of SPIE – The International Society for Optical Engineering 6540, 65401J (2007).CrossRefGoogle Scholar
Ruddy, F. H., Flammang, R. W. and Seidel, J. G., Nucl. Instrum. Meth. A598, 518 (2009).CrossRefGoogle Scholar
Ruddy, F. H., Seidel, J. G., Flammang, R. W., Petrović, B., Dulloo, A. R. and Congedo, T., “Pulsed Neutron Interrogation for Detection of Concealed Special Nuclear Materials”, Non-Intrusive Inspection Technologies Vourvopoulos, G. and Doty, F. (Eds.), Proceedings of SPIE – The International Society for Optical Engineering 6213, 6213OD (2006).CrossRefGoogle Scholar
Ruddy, F. H., Seidel, J. G., Flammang, R. W. and Singh, R., and Schroeder, J., Nuclear Science Symposium Conference Record NSS/MIC 2008, 449 (2008).Google Scholar
“Special Nuclear Material Detection Using Pulsed Neutron Interrogation”, F. H. Ruddy, J. G. Seidel, and R. W. Flammang, Optics and Photonics in Global Homeland Security (T. T. Saito D. Lehrfeld and M. J. DeWeert, Eds.) Proceedings of SPIE - The International Society for Optical Engineering Volume 6540, 65401I (2007).Google Scholar
Ruddy, F. H., Dulloo, A. R., Seidel, J. G., Hantz, F. W., and Grobmyer, L. R., Nuclear Technology 140, 198 (2002)CrossRefGoogle Scholar
Manfredotti, C., Lo Giudice, A., Fasalo, F., Vittone, E., Paolini, C., Fizzotti, F., Zanini, A., Wagner, G. and Lanzieri, C., Nucl. Instrum. Meth. A552, 131 (2005).CrossRefGoogle Scholar
Lo Giudice, A., Fasolo, F., Durisi, E., Manfredotti, C., Vittone, E., Fizzotti, F., Zanini, A. and Rosi, G., Nucl. Instrum. Meth. A583, 177 (2007).CrossRefGoogle Scholar
Petrović, B., Ruddy, F. H. and Lombardi, C., “Optimum Strategy For Ex-Core Dosimeters/Monitors In The Iris Reactor”, Reactor Dosimetry in the 21st Century, Wagemans, J., Abderrahim, H. A., D’hondt, P., and De Raedt, C. (Eds.), World Scientific, Londonpp 43–50 (2003).CrossRefGoogle Scholar
Ruddy, F. H., Seidel, J. G., Blue, T. E., and Miller, D. W., “Reactor Power Monitoring Using Silicon Carbide Fast Neutron Detectors”, PHYSOR-2006 – American Nuclear Society’s Topical Meeting on Reactor Physics, 2006, pp (2006).Google Scholar
Dulloo, A. R., Ruddy, F. H., Seidel, J. G., Flinchbaugh, T., Davison, C., and Daubenspeck, T., “Neutron and Gamma Ray Dosimetry in Spent-Fuel Radiation Environments Using Silicon Carbide Semiconductor Radiation Detectors”, Reactor Dosimetry: Radiation Metrology and Assessment, ASTM STP 1398, Williams, John G., Vehar, David W., Ruddy, Frank H., and Gilliam, David M., Eds., American Society for Testing and Materials, West Conshohoken, PA, pp 683–690 (2001).CrossRefGoogle Scholar
Natsume, T., Doi, H., Ruddy, F. H., Seidel, J. G., and Dulloo, A. R., Journal of ASTM International 3, Online Issue 3, March 2006 Google Scholar
Ruddy, F. H., Patel, J. U., and Williams, J. G., “Power Monitoring in Space Nuclear Reactors Using Silicon Carbide Radiation Detectors”, Proceedings of the Space Nuclear Conference, San Diego, June 2005, American Nuclear Society CD ISBN: 0-89448-696-9, Paper 1072, pp 468–475. (2005)Google Scholar
Krishnan, V. and Blue, T. E., Transactions of the American Nuclear Society 96, 459 (2007)Google Scholar
Kumar, A., Garcia, T. R., Reinke, B., Blue, T. E. and Windl, W., Paper WW1.03 (this Meeting), to be published in Proceedings of the Materials Research Society (2013).Google Scholar
Bruzzi, M., Lagomarsino, S., Nava, F. and Sciortino, S., Diamond and Related Materials 12, 1205 (2003).CrossRefGoogle Scholar