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Scanning Conduction Microscopy: A Method of Probing Abrasion of Insulating Thin Films on Conducting Substrates
Published online by Cambridge University Press: 15 February 2011
Abstract
The use of Scanning Force Microscopy (SFM) to probe wear processes at interfaces is of considerable interest. We present here a simple modification of the SFM which allows us to make highly spatially resolved measurements of conductivity changes produced by abrasion of thin insulating films on metal substrates. The technique is demonstrated on fluorocarbon polymer thin films deposited on stainless steel substrates.
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- Copyright © Materials Research Society 1995