Hostname: page-component-848d4c4894-x5gtn Total loading time: 0 Render date: 2024-05-10T22:36:33.530Z Has data issue: false hasContentIssue false
  • English
  • Français

RHEED Observation of Tin Atomic Chains Formation on Vicinal Gallium Arsenide Plane

Published online by Cambridge University Press:  17 March 2011

Aleksey Senichkin ,
Aleksandr Bugaev  and
Vladimir Mokerov
Aleksey Senichkin
Affiliation:
Institute of Radio Engineering and Electronics of RAS, 103907, 11 Mokchovaia str., Moscow, Russia
Aleksandr Bugaev
Affiliation:
Institute of Radio Engineering and Electronics of RAS, 103907, 11 Mokchovaia str., Moscow, Russia
Vladimir Mokerov
Affiliation:
Institute of Radio Engineering and Electronics of RAS, 103907, 11 Mokchovaia str., Moscow, Russia
Get access

Abstract

In the present work by means of measurements of RHEED intensity the research of the arrangement of tin atoms on vicinal surfaces of GaAs crystals was carried out. The orientation of crystals was close to (001). The intensity of diffracted electrons was measured in different points of the diffraction picture to reveal the arrangement of tin atoms on terraces or on edges of terraces. It was shown that tin atoms may decorate edges of terraces and thus form chains. Concentrations of tin atoms located on terraces and their edges were established. It was revealed, that tin atoms decorate edges of terraces only at rather high temperatures of a substrate.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 648: Symposium P – Growth, Evolution & Properties of Surfaces, Thin Films, and Self Organized Structure , 2000 , P3.40
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Kulbachinskii, V.A., Lunin, R.A., Kytin, V.G., Bugaev, A.S., Senichkin, A.P., Demin, A.V., MicroelectronicEngineering 43–44, 319–324 (1998).Google Scholar
2. Heidenreich, R., Fundamentals of Transmission Electron Microscopy, Inter Science Publishers, (1964).Google Scholar
3. Cowley, J.M., Diffraction Physics, (North - Holland Publishing Company, 1975).Google Scholar
4. Pashley, D., Haberem, K.W. and Gaines, J.M., J. Vac. Sci. Technol. B9, 938–943 (1991).Google Scholar
5. Senichkin, A.P., Bugaev, A.S., Mokerov, V.G., Fursin, L.G., Surface: X-ray, synchrotron and neutron investigations (Russian) 10, 20–26 (1997).Google Scholar