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Quantitative Measurements of Segregation In Co-Cr-X Magnetic Recording Media by Energy-Filtered Transmission Electron Microscopy

Published online by Cambridge University Press:  10 February 2011

J. Bentley ,
J.E. Wittig  and
T.P. Nolan
J. Bentley
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN 37831-6376, bentleyj@ornl.gov
J.E. Wittig
Affiliation:
Vanderbilt University, Nashville, TN 37235
T.P. Nolan
Affiliation:
Komag Inc., 1704 Automation Parkway, San Jose, CA 95131
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Abstract

Reliable core-loss spectroscopic methods have been developed for mapping elemental segregation in Co-Cr-X magnetic recording media by energy-filtered transmission electron microscopy. Extraction of quantitative compositions at a spatial resolution approaching 1 nm involves sophisticated treatments for diffraction contrast, variations in specimen thickness, and closely-spaced oxygen K and chromium L23 ionization edges. These methods reveal that intergranular chromium levels are ∼25 at.% for random-angle boundaries and ∼15 at.% for 90° boundaries in films of Co84Cr12Ta4 d.c. magnetron sputtered at 250°C.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 517: Symposium F – Wide Bandgap Semiconductors for High Power, High Frequency , January 1998 , 205
Copyright
Copyright © Materials Research Society 1998

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