Hostname: page-component-848d4c4894-5nwft Total loading time: 0 Render date: 2024-05-12T19:36:30.063Z Has data issue: false hasContentIssue false
  • English
  • Français

Positron Annihilation Spectroscopy of Defects in Solid

Published online by Cambridge University Press:  26 February 2011

P. Hautojärvi
P. Hautojärvi*
Affiliation:
Laboratory of Physics, Helsinki University of Technology, 02150 Espoo, Finland
Get access

Abstract

The use of positron annihilation to study vacancy defects and some recent results are reviewed. For metals, theoretical calculations have reached the leyel where they can reliably predict lifetime values of positrons trapped at vacancy defects of various size, geometry and impurity environment. Experimental results are shown on vacancy recovery and vacancysolute interaction in electron irradiated Fe, Nb, and Ta. During last years the technique has been applied also to semiconductors. Positron trapping in Si is discussed and some results are given on native and irradiation induced vacancies in GaAs. A beam of slow positrons is a new tool to probe nearsurface regions and thin films. Examples are shown on Mo(111) surface sputtered with Ar+ ions and on Si(100) implanted with 35 keV H+ ions.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 82: Symposium I – Characterization of Defects in Materials , 1986 , 3
Copyright
Copyright © Materials Research Society 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1) Positrons in Solids, edited by Hautojärvi, P., Topics in Current Physics, vol. 12 (Springer-Verlag, Heidelberg, 1979).CrossRefGoogle Scholar
2) Positron Solid State Physics, edited by Brandt, W. and Dupasquier, A. (North-Holland, Amsterdam, 1983).Google Scholar
3) Positron Annihilation, Proceedings of the 6th International Conference on Positron Annihilation, edited by Coleman, P.G., Sharma, S.C., and Diana, L.M. (North-Holland, Amsterdam, 1982).Google Scholar
4) Positron Annihilation, Proceedings of the 7th International Conference on Positron Annihilation, edited by Jain, P.C., Singru, R.M., and Gopinathan, K.P. (World Scientific, Singapore, 1985).Google Scholar
5) Vehanen, A. and Rytsölä, K., in Ref. 2, p. 659.Google Scholar
6) Hautojärvi, P., Huomo, H., Puska, M., and Vehanen, A., Phys. Rev. B 32, 4326 (1986).CrossRefGoogle Scholar
7)See e.g. West, R.N., in Ref. 1, p. 89.Google Scholar
8)See e.g. Nieminen, R.M. and Manninen, M.J., in Ref. 1, p. 145.Google Scholar
9) Nieminen, R.M. and Laakkonen, J., Appl. Phys. 20, 181 (1979).CrossRefGoogle Scholar
10) Fluss, M.J., Berko, S., Chakraborty, B., Hoffman, K.R., Lippel, P., and Siegel, R.W., J. Phys. F 14, 2831 (1984).CrossRefGoogle Scholar
11) Puska, M.J. and Nieminen, R.M., J. Phys. F 13, 333 (1983).CrossRefGoogle Scholar
12) Hansen, H.E., Nieminen, R.M., and Puska, M.J., J. Phys. F 14, 1299 (1984).CrossRefGoogle Scholar
13) Corbel, C., Puska, M., and Nieminen, R.M., Rad. Eff. 79, 305 (1983).CrossRefGoogle Scholar
14) Siegel, R.W., in Ref. 3, p. 351.Google Scholar
15) Schäfer, H.E., in Ref. 3, p. 369.Google Scholar
16) DeSchepper, L., Segers, D., Dorikens-Vanpraet, L., Dorikens, M., Knuyt, G., Stals, L.M., and Moser, P., Phys. Rev. B 27, 5257 (1983).CrossRefGoogle Scholar
17) Maier, K., Peo, M., Saile, B., Schäfer, H.E.,and Seeger, A., Phil. Mag. A 40, 701 (1979).CrossRefGoogle Scholar
18) Hautojärvi, P., Judin, T., Vehanen, A., Yli-Kauppila, J., Johansson, J., Verdone, J., and Moser, P., Solid State Commun. 29, 855 (1979).CrossRefGoogle Scholar
19) Hautojärvi, P., Johansson, J., Vehanen, A., Yli-Kauppila, J., and Moser, P., Phys. Rev. Lett. 44, 1326 (1980).CrossRefGoogle Scholar
20) Vehanen, A., Hautojärvi, P., Johansson, J., Yli-Kauppila, J., and Moser, P., Phys. Rev. B 25, 762 (1982).CrossRefGoogle Scholar
21) Puska, M.J. and Nieminen, R.M., J. Phys. F 12, L211 (1982).CrossRefGoogle Scholar
22) Corbel, C., Rapport CEA-R-5334 (Commissariat a l'Energie Atomique, Saclay 1986).Google Scholar
23) Mbslang, A., Albert, E., Recknagel, E., and Weidinger, A., Hyp. Int. 15/16, 409 (1983).CrossRefGoogle Scholar
24) Schultz, H., in Point Defects and Defect Interactions in Metals, edited by Takamura, J.-I., Doyama, M., and Kiritani, M. (University of Tokyo Press, Tokyo, 1982), p. 183.Google Scholar
25) Metzner, H., Sielemann, R., Klaumünzer, S., Butt, R., and Semmler, W., Z. Phys. B 61, 267 (1985).CrossRefGoogle Scholar
26) Dannefaer, S., Dean, G.W., Kerr, D.P., and Hogg, B.G., Phys. Rev. B 14, 2709 (1976).CrossRefGoogle Scholar
27) Fush, W., Holzhauer, U., Mantl, S., Richter, F.W., and Sturm, R., Phys. Stat. Sol. (b) 89, 69 (1978).Google Scholar
28) Shimotomai, M., Ohgino, Y., Fukushima, H., Mihara, T., Inoue, K., and Doyama, M., in Defects and Radiation Effects in Semiconductors (Oiso, Japan) 1980, Inst. Phys. Conf. Ser. 59, p. 241.Google Scholar
29) Puska, M.J., Jepsen, O., and Nieminen, R.M., Phys. Rev. B, 34, 2695 (1986).CrossRefGoogle Scholar
30) Dannefaer, S., Mascher, P., and Kerr, D., Phys. Rev. Lett. 56, 2195 (1986).CrossRefGoogle Scholar
31) Dannefaer, S., Hogg, B., and Kerr, D., Phys. Rev. B 30, 3355 (1984).CrossRefGoogle Scholar
32) Dlubek, G., Brümmer, O., Plazaola, F., and Hautojarvi, P., J. Phys. C 19, 331 (1986).CrossRefGoogle Scholar
33) Stucky, M., Paulin, R., Geffroy, B., Corbel, C., and Suskij, J., in Ref. 4, pp. 714.Google Scholar
34) Dannefaer, S. and Kerr, P., J. Appl. Phys., to be published.Google Scholar
35) Hautojärvi, P., Moser, P., Stucky, M., and Corbel, C., Appl. Phys. Lett. 48, 809 (1986).CrossRefGoogle Scholar
36) Rest, J. Van der and Pecheur, P., Physica, B 116, 121 (1983).CrossRefGoogle Scholar
37) Corbel, C., private communication.Google Scholar
38) Mills, A.P. Jr., in Ref. 2, p. 432.Google Scholar
39) Lahtinen, J., Vehanen, A., Huomo, H., J. Mäkinen, Huttunen, P., Rytsölä, K., Bentzon, M., and Hautojärvi, P., Nucl. Instr. Meth. B17, 73 (1986).CrossRefGoogle Scholar
40) Vehanen, A., Mäkinen, J., Hautojärvi, P., Huomo, H., and Lahtinen, J., Phys. Rev. B 32, 7561 (1985); see also J. Mäkinen, A. Vehanen, P. Hautojärvi, H. Huomo, J. Lahtinen, R.M. Nieminen, S. Valkealahti, Surf. Sci. 175, 385 (1986).CrossRefGoogle Scholar
41) Bentzon, M.D., Huomo, H., Vehanen, A., Hautojärvi, P., Lahtinen, J., and Hautala, M., J. Phys. F, in press.Google Scholar
42) Keinonen, J., Hautala, M., Rauhala, E., Erola, M., Lahtinen, J., Huomo, H., Vehanen, A., and Hautojarvi, P., to be published.Google Scholar