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Polymer Layer Ordering of Polyaniline Derivatives in Pled Devices: Surface Adsorption and Characterization

Published online by Cambridge University Press:  10 February 2011

R. C. Advincula
Affiliation:
currently with the Department of Chemistry, University of Alabama at Birmingham, Birmingham, AL 35294
W. Knoll
Affiliation:
Max Planck Institute for Polymer Research, Mainz, Germany D-55021
C. W. Frank
Affiliation:
Department of Chemical Engineering and Center for Polymer Interfaces and Macromoleculer Assemblies (CPIMA), Stanford University, Stanford, CA 94305
D. Roitman
Affiliation:
Hewlett-Packard, Solid State Laboratories, Palo Alto, CA 94304
R. Moon
Affiliation:
Hewlett-Packard, Solid State Laboratories, Palo Alto, CA 94304
J. Sheats
Affiliation:
Hewlett-Packard, Solid State Laboratories, Palo Alto, CA 94304
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Abstract

The fabrication and characterization of polyaniline (PANI) derivatives deposited on ITO coated glass is investigated as possible hole injection layers for MEH-PPV based polymer light emitting diode (PLED) devices. This involved multilayer ordering by the alternate polyelectrolyte adsorption of polyaniline and sulfonated poyaniline with an oppositely charged polyelectrolyte from solution. A combination of spectroscopic and microscopic techniques was utilized to determine the layer ordering, film structure, morphology, and homogeneity. The deposition process generally showed a linear behavior for all pairs as shown by ellipsometry and UV-vis spectroscopy. However, surface plasmon spectroscopy (SPS) and AFM revealed that thicker films are accompanied by increased surface roughness regardless of concentration. Comparison in performance was made between bare ITO and PANI or SPANI coated devices. Initial investigations of PLED performance showed significant improvements in lifetime and efficiency compared to bare ITO.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

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References

[1] Yang, Y. and Heeger, A.J. J. Appl. Phys. 64, 1245 (1994).Google Scholar
[2] Scott, J.C., Carter, S., Karg, S., and Angelopoulos, M. Synth. Metals. 85, 1197 (1997).Google Scholar
[3] Parker, I.D. J. Appl. Phys. 75, 1656 (1994).Google Scholar
[4] Ferreira, M., Cheung, J., Rubner, M. Thin Solid Films 244, 772 (1994).Google Scholar
[5] Advincula, R., Knoll, W., Frank, C., Roitman, D., Sheats, J. to be submitted to Chem. MaterialsGoogle Scholar
[6] MacDiarmid, A., Chiang, J., Richter, A., Somasiri, N. in Conducting Polymers ed. Alcacer, L. (D. Reidel Publishing, New York, 1987) p. 105120.Google Scholar
[7] Epstein, A.J. and Yue, J., J. Am. Chem. Soc. 112, 2800 (1990).Google Scholar
[8] Cheung, J. H., Stockton, W., Rubner, M. F., Macromolecules 30, 2712 (1997).Google Scholar
[9] Rothenhausler, B., Duschl, C., and Knoll, W., Thin Solid Films 159, 323 (1988).Google Scholar
[10] Roitman, D., Sheats, J., Antoniadis, H., Hueschen, M., Proc. Int. SAMPE Technical Conference 27, 681 (1995).Google Scholar
[11] Ferreira, M. and Rubner, M.F. Macromolecules 28, 7107 (1995).Google Scholar
[12] Advincula, R., Aust, E., Meyer, W., Knoll, W., Langmuir, 12, 3536 (1996).Google Scholar
[13] Reed, C. E., Kanazawa, K.K., and Kaufman, J. H., J. Appl. Phys. 68, 1993 (1990).Google Scholar
[14] Sinha, S.K., Physica B, 173, 25 (1991).Google Scholar
[15] Antoniadis, H., Hueschen, M.R., McElvain, J., Miller, J.N., Moon, R., Roitman, D., and Sheats, J., Polymer Preprints 38, 382 (1997).Google Scholar