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Plastic Packaging Reliability of Optoelectronic Devices for Telecom Use

Published online by Cambridge University Press:  10 February 2011

Mitsuo Fukuda  and
Kuniharu Kato
Mitsuo Fukuda
Affiliation:
NTT Opto-electronics Laboratories 3-1, Morinosato Wakamiya, Atsugi-shi, Kanagawa, 243-01Japan, mfukuda@aecl.ntt.co.jp
Kuniharu Kato
Affiliation:
162, Shirakata Shirane, Toukai-mura, Naka-gun, Ibaraki, 319-11, Japan
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Abstract

Two types of plastic modules for laser diodes and photodiodes are developed and tested under various environmental conditions. The stable operations for both types of modules are confirmed under various long-term aging tests, high humidity high temperature tests (85°C, 85% RH), and temperature cycling tests (-40 / +85°C). These plastic moduless are potentially suitable for economic access networks.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 531: Symposium DD – Reliabilty of Photonics Materials & Structures , 1998 , 101
Copyright
Copyright © Materials Research Society 1998

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References

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