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Pinning of Misfit Dislocations in film Growth Studied by Grazing Incidence X-ray Scattering
Published online by Cambridge University Press: 21 February 2011
Abstract
Using grazing incidence x-ray scattering, we have studied incommensurate structures of Pb adlayers on Cu(110) surface and epitaxial Al films grown on Si(111) surface. Similar diffuse scattering profiles were found in both cases, which can be fitted with a Gaussian-plus-Lorentzian lineshape. The results are attributed to a overlayer structure with pinned misfit dislocations at the interface.
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- Copyright © Materials Research Society 1992